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K. Bennamane

DC and low frequency noise characterization of FinFET devices
2009 · K. Bennamane, T. Boutchacha, et al. · Solid-State Electronics · 48
Electrical transport characterization of nano CMOS devices with ultra-thin silicon film
2009 · G. Ghibaudo, M. Mouis, et al. · International Workshop on Junction Technology · 27
Static and Low Frequency Noise Characterization of InGaAs MOSFETs and FinFETs on Insulator
2018 · T. A. Karatsori, K. Bennamane, et al. · European Solid-State Device Research Conference · 12
Mobility coupling effects due to remote Coulomb scattering in thin‐film FD‐SOI CMOS devices
2013 · K. Bennamane, I. Ben Akkez, et al. · Electronics Letters · 9
Method for extraction of η parameter characterising µ eff against E eff curves in FD-SOI Si MOS devices
2009 · K. Bennamane, G. Ghibaudo, et al. · Electronics Letters · 9
Tracking Strategy Based on Magnetic Sensors for Microrobot Navigation in the Cochlea
2020 · Tarik Kroubi, Karim Belharet, et al. · IEEE/RSJ International Conference on Intelligent Robots and Systems (IROS) · 5
New Concept of Differential Effective Mobility in MOS Transistors
2019 · K. Bennamane, G. Ghibaudo · Active and Passive Electronic Components · 3
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Characterization of the Short Channel Effect on the Threshold Voltage in Deep Sub-micron MOSFETs
2009 · Ahcene Lakhlef, A. Benfdila, et al. · The African review of physics · 3
Extraction of η parameter characterising μ eff against E eff curves in strained Si nMOS devices
2008 · K. Bennamane, M. DeMichielis, et al. · Electronics Letters · 3
Novel on-resistance based methodology for MOSFET electrical characterization
2019 · T.A. Karatsori, K. Bennamane, et al. · Solid-State Electronics · 2
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Static and low frequency noise characterization of FinFET devices
2009 · K. Bennamane, T. Boutchacha, et al. · Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon · 2
New Methodology for Series-Resistance-Immune MOSFET Parameter Extraction from Linear to Saturation Region
2019 · T. A. Karatsori, K. Bennamane, et al. · Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon
Low temperature characterization of different deep submicron SOI and FinFET devices
2010 · Jomaah, J., Bennamane, K., et al. · HAL
Drift-diffusion and Ballistic Mobility Characterization in Nano CMOS Devices
2009 · Ghibaudo, G., Mouis, M., et al. · HAL
Works count: 14
Citation count: 123
H-index: 5
I10-index: 3
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