Author

Fakhrozi Che Ani

Observed names: F CHE ANI, F Che Ani, F. C. Ani, F. Che Ani, F.C. Ani
ORCID: 0000-0001-7023-5591
Observed ORCID: 0000-0001-7023-5591
OpenAlex ID: A5078970936
2009 · C.Y. Khor, Z.M. Ariff, et al. · International Communications in Heat and Mass Transfer · 58
2009 · C.Y. Khor, M.Z. Abdullah, et al. · International Communications in Heat and Mass Transfer · 52
2014 · M.S. Abdul Aziz, M.Z. Abdullah, et al. · International Journal of Heat and Mass Transfer · 51
2012 · Chun‐Sean Lau, M.Z. Abdullah, et al. · Soldering and Surface Mount Technology · 51
2016 · Aizat Abas, Haslinda M.S., et al. · Microelectronic Engineering · 42
2013 · M.S. Abdul Aziz, M.Z. Abdullah, et al. · International Communications in Heat and Mass Transfer · 42
2009 · C.Y. Khor, M. Abdul Mujeebu, et al. · Microelectronics Reliability · 40
2015 · Aizat Abas, M.H.H. Ishak, et al. · Microelectronics Reliability · 38
2018 · Fakhrozi Che Ani, Azman Jalar, et al. · Soldering and Surface Mount Technology · 37
2016 · Muhamad Zamri Yahaya, Fakhrozi Che Ani, et al. · Materials Science and Engineering A · 36
2011 · C.Y. Khor, M.Z. Abdullah, et al. · Microelectronic Engineering · 36
2018 · F. Che Ani, A. Jalar, et al. · The International Journal of Advanced Manufacturing Technology · 35
2012 · Chun-Sean Lau, Mohd Zulkifly Abdullah, et al. · IEEE Transactions on Components Packaging and Manufacturing Technology · 31
2012 · Chun‐Sean Lau, M.Z. Abdullah, et al. · Soldering and Surface Mount Technology · 31
2024 · Rilwan Kayode Apalowo, Mohamad Aizat Abas, et al. · Soldering and Surface Mount Technology · 26
2018 · Fakhrozi Che Ani, Azman Jalar, et al. · Soldering and Surface Mount Technology · 25
2021 · S. Zulfiqar, A.A. Saad, et al. · Microelectronics Reliability · 21
2012 · C.Y. Khor, M.Z. Abdullah, et al. · International Communications in Heat and Mass Transfer · 20
2015 · M. S. Abdul Aziz, M. Z. Abdullah, et al. · Numerical Heat Transfer Part A Applications · 19
2024 · Feifan Yi, Ahmad Sufril Azlan Mohamed, et al. · PeerJ Computer Science · 18
2023 · Rilwan Kayode Apalowo, Aizat Abas, et al. · Microelectronics Reliability · 18
Works count: 97
Citation count: 1,228
H-index: 21
I10-index: 37
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