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S. A. Kornev
Observed names:
S.A. Kornev,
Sergey A. Kornev
Institution:
Bauman Moscow State Technical University
Observed institutions:
Russian Academy of Sciences,
Bauman Moscow State Technical University,
Baikov Institute of Metallurgy and Materials Science
ORCID:
0000-0001-9235-3804
Observed ORCID:
0000-0001-9235-3804
OpenAlex ID:
A5083453409
Tungsten Carbide and Vanadium Carbide Nanopowders Synthesis in DC Plasma Reactor
2013
·
A. V. Samokhin
, N. V. Alekseev
, et al.
·
Plasma Chemistry and Plasma Processing
·
42
Change in the Charge State of MOS Structures under Radiation and High-Field Injection at a Constant Voltage
2025
·
D. V. Andreev
, S. A. Kornev
, et al.
·
Journal of Surface Investigation X-ray Synchrotron and Neutron Techniques
·
3
Modification of Constant Voltage Stress Method for Characterizing Time-Dependent Dielectric Breakdown of Thin Gate Dielectrics of MOS Devices
2025
·
D. V. Andreev
, S. A. Kornev
, et al.
·
Russian Microelectronics
·
1
Using Injection-Thermal Treatment to Reduce Defectiveness of Dielectric Films of MIS Structures
2025
·
D. V. Andreev
, S. A. Kornev
, et al.
·
Inorganic Materials Applied Research
·
1
Synthesis of nanopowders of elements and compounds in thermal plasma
2010
·
А. В. Самохин
, N.N. Alexeev
, et al.
·
Bulletin of the American Physical Society
·
1
The Effect of the Gate Material in MIS Structures on the High-Field Charge Degradation in the Gate Dielectric
2026
·
D. V. Andreev
, S. A. Kornev
, et al.
·
Inorganic Materials Applied Research
Designing a Configurable 32-Bit Microprocessor Based on RISC-V Architecture for Specialized Applications
2026
·
Sergey A. Kornev
, Vladimir V. Andreev
, et al.
·
Lecture notes in networks and systems
The influence of the gate material of MIS structures on the processes of high-field charge degradation of the gate dielectric
2026
·
D. V. Andreev
, S. A. Kornev
, et al.
·
Perspektivnye Materialy
Use of injection-thermal treatment to lower defectiveness of dielectric films of MIS structures
2025
·
D. V. Andreev
, S. A. Kornev
, et al.
·
Perspektivnye Materialy
Designing a Configurable 32-Bit RISC-V Microprocessor
2022
·
S.A. Kornev
, V.V. Andreev
·
Problems of advanced micro- and nanoelectronic systems development
PDF
Size characteristics of copper nanopowders before and after oxidation
2013
·
E. N. Sidorova
, A. V. Samokhin
, et al.
·
Russian Journal of Non-Ferrous Metals
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Works count:
11
Citation count:
48
H-index:
2
I10-index:
1
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