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Sofie Beyne

Observed names: Beyne, Sofie, S. Beyne
Institution: IMEC
ORCID: 0000-0002-5138-0280
Observed ORCID: 0000-0002-5138-0280
OpenAlex ID: A5084107315
Interconnect metals beyond copper: reliability challenges and opportunities
2018 · K. Croes, Ch. Adelmann, et al. · Technical digest - International Electron Devices Meeting/Technical digest · 92
Sub-100 nm 2 Cobalt Interconnects
2018 · Shibesh Dutta, Sofie Beyne, et al. · IEEE Electron Device Letters · 84
Industry-compatible silicon spin-qubit unit cells exceeding 99% fidelity
2025 · Paul Steinacker, Nard Dumoulin Stuyck, et al. · Nature · 59
Electromigration Activation Energies in Alternative Metal Interconnects
2019 · Sofie Beyne, Olalla Varela Pedreira, et al. · IEEE Transactions on Electron Devices · 44
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1/f noise measurements for faster evaluation of electromigration in advanced microelectronics interconnections
2016 · Sofie Beyne, Kristof Croes, et al. · Journal of Applied Physics · 32
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Low-frequency noise and defects in copper and ruthenium resistors
2019 · D. M. Fleetwood, S. Beyne, et al. · Applied Physics Letters · 14
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The first observation of p-type electromigration failure in full ruthenium interconnects
2018 · Sofie Beyne, Shibesh Dutta, et al. · IEEE International Reliability Physics Symposium proceedings · 13
Study of the enhanced electromigration performance of Cu(Mn) by low-frequency noise measurements and atom probe tomography
2017 · Sofie Beyne, Laurent Arnoldi, et al. · Applied Physics Letters · 10
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A novel electromigration characterization method based on low-frequency noise measurements
2019 · Sofie Beyne, Olalla Varela Pedreira, et al. · Semiconductor Science and Technology · 9
Understanding EM-Degradation Mechanisms in Metal Heaters Used for Si Photonics Applications
2019 · K. Croes, V. Simons, et al. · IEEE International Reliability Physics Symposium proceedings · 8
1/f Noise measurements for faster electromigration characterization
2016 · Sofie Beyne, Kristof Croes, et al. · IEEE International Reliability Physics Symposium proceedings · 7
A tri-linear quantum dot architecture for semiconductor spin qubits
2026 · R. Li, V. Levajac, et al. · Scientific Reports · 6
On the design of an automated system for the characterization of the electromigration performance of advanced interconnects by means of low-frequency noise measurements
2019 · Graziella Scandurra, Sofie Beyne, et al. · Metrology and Measurement Systems · 5
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Direct correlation between low-frequency noise measurements and electromigration lifetimes
2017 · Sofie Beyne, Kristof Croes, et al. · IEEE International Reliability Physics Symposium proceedings · 5
Demonstration of 99.9% single qubit control fidelity of a silicon quantum dot spin qubit made in a 300 mm foundry process
2024 · N. Dumoulin Stuyck, M.K. Feng, et al. · IEEE Silicon Nanoelectronics Workshop · 4
Demonstration of low-frequency noise measurements for studying electromigration mechanisms in advanced nano-scaled interconnects
2017 · Sofie Beyne, Kristof Croes, et al. · International Conference on Noise and Fluctuations · 4
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Study of electromigration mechanisms in 22nm half-pitch Cu interconnects by 1/f noise measurements
2017 · S. Beyne, K. Croes, et al. · IEEE International Interconnect Technology Conference (IITC) · 4
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Experimental validation of electromigration by low frequency noise measurement for advanced copper interconnects application
2015 · B. J. Tang, K. Croes, et al. · International Conference on Noise and Fluctuations · 3
Low-Frequency Noise Measurements to Characterize Cu-Electromigration Down to 44nm Metal Pitch
2019 · Sofie Beyne, Olalla Varela Pedreira, et al. · IEEE International Reliability Physics Symposium proceedings · 2
Fluctuation Scaling in metals
2017 · Sofie Beyne, Tim Beyne · International Conference on Noise and Fluctuations · 2
Precision high-speed quantum logic with holes on a natural silicon foundry platform
2026 · Isaac Vorreiter, Jonathan Y. Huang, et al. · Nature Communications · 1
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Eight-qubit operation of a 300 mm SiMOS foundry-fabricated device
2026 · Andreas Nickl, Nard Dumoulin Stuyck, et al. · Nature Communications · 1
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Concatenated continuous driving of silicon qubit by amplitude and phase modulation
2026 · Takuma Kuno, Takeru Utsugi, et al. · Physical review. B./Physical review. B · 1
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300mm fabrication of silicon quantum dot spin qubits using 0.33NA EUV lithography
2025 · S. Beyne, S. Kubicek, et al. · Technical digest - International Electron Devices Meeting/Technical digest · 1
Statistical analysis of spurious dot formation in silicon metal-oxide-semiconductor single electron transistors
2025 · Kuan-Chu Chen, Clement Godfrin, et al. · Physical review. B./Physical review. B · 1
Works count: 39
Citation count: 412
H-index: 9
I10-index: 8
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