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Romeo Letor

Observed name: R. Letor
OpenAlex ID: A5085603679
Static and dynamic behavior of paralleled IGBTs
1992 · R. Letor · IEEE Transactions on Industry Applications · 86
A new driving circuit for IGBT devices
1995 · C. Licitra, S. Musumeci, et al. · IEEE Transactions on Power Electronics · 71
Thermal instability of low voltage power-MOSFETs
2000 · A. Consoli, F. Gennaro, et al. · IEEE Transactions on Power Electronics · 63
Innovative localized lifetime control in high-speed IGBTs
1997 · M. Saggio, V. Raineri, et al. · IEEE Electron Device Letters · 50
Fast thermal fatigue on top metal layer of power devices
2002 · Sebastiano Russo, Romeo Letor, et al. · Microelectronics Reliability · 41
Sensorless position control of DC actuators for automotive applications
2004 · A. Consoli, G. Bottiglieri, et al. · IEEE Industry Applications Society Annual Meeting (IAS) · 38
Smart Power devices and new electronic fuses compliant with new E/E architecture for autonomous driving
2019 · Romeo Letor, Roberto Crisafulli · AEIT International Conference of Electrical and Electronic Technologies for Automotive (AEIT AUTOMOTIVE) · 32
Stress analysis and lifetime estimation on power MOSFETs for automotive ABS systems
2008 · A. Testa, S. De Caro, et al. · IEEE Power Electronics Specialists Conference (PESC) · 32
A new PSpice power MOSFET model with temperature dependent parameters: evaluation of performances and comparison with available models
2002 · C. Leonardi, A. Raciti, et al. · IEEE Industry Applications Society Annual Meeting (IAS) · 29
Short circuit behavior of IGBTs correlated to the intrinsic device structure and on the application circuit
1995 · R. Letor, G. Candeloro Aniceto · IEEE Transactions on Industry Applications · 29
Reliability enhancement with the aid of transient infrared thermal analysis of smart Power MOSFETs during short circuit operation
2005 · A. Irace, G. Breglio, et al. · Microelectronics Reliability · 28
PT-IGBT PSpice model with new parameter extraction for life-time and epy dependent behaviour simulation
2002 · S. Musumeci, A. Raciti, et al. · IEEE Power Electronics Specialists Conference (PESC) · 28
Short circuit behaviour of IGBTs correlated to the intrinsic device structure and on the application circuit
2003 · R. Letor, C.G. Aniceto · IEEE Industry Applications Society Annual Meeting (IAS) · 27
Static and dynamic behaviour of paralleled IGBTs
2002 · R. Letor · IEEE Industry Applications Society Annual Meeting (IAS) · 24
Fast transient infrared thermal analysis of smart Power MOSFETS in permanent short circuit operation
2006 · G. Breglio, A. Irace, et al. · IEEE International Symposium on Power Semiconductor Devices and ICs/Proceedings of the International Symposium on Power Semiconductor Devices & ICs/Proceedings of the ... International Symposium on Power Semiconductor Devices & ICs/Proceedings of the ... International Symposium on Power Semiconductor Devices and ICs · 16
Comparative investigation on power losses in soft-switching insulated gate devices
2002 · A. Consoli, C. Licitra, et al. · IEEE International Symposium on Power Semiconductor Devices and ICs/Proceedings of the International Symposium on Power Semiconductor Devices & ICs/Proceedings of the ... International Symposium on Power Semiconductor Devices & ICs/Proceedings of the ... International Symposium on Power Semiconductor Devices and ICs · 13
Reliability of planar, Super-Junction and trench low voltage power MOSFETs
2010 · A. Testa, S. De Caro, et al. · Microelectronics Reliability · 12
Life time prediction and design for reliability of Smart Power devices for automotive exterior lighting
2008 · R. Letor, S. Russo, et al. · 12
A new power MOSFET model including the variation of parameters with the temperature
2002 · C. Leonardi, A. Raciti, et al. · International Caribbean Conference on Devices, Circuits and Systems · 9
Estimation of the shaft position on low-cost DC actuators
2010 · R. Letor, A. Testa, et al. · IEEE International Symposium on Industrial Electronics (ISIE) · 8
An Infrared Thermal Measuring System for Automotive Applications and Reliability Improvement
2011 · S. Panarello, S. Patane’, et al. · Lecture notes in electrical engineering · 7
Thermal instability of low voltage power-MOSFETs
2003 · A. Consoli, F. Gennaro, et al. · IEEE Power Electronics Specialists Conference (PESC) · 7
Optimum driving circuit for IGBT devices suitable for integration
2005 · C. Licitra, S. Musumeci, et al. · IEEE International Symposium on Power Semiconductor Devices and ICs/Proceedings of the International Symposium on Power Semiconductor Devices & ICs/Proceedings of the ... International Symposium on Power Semiconductor Devices & ICs/Proceedings of the ... International Symposium on Power Semiconductor Devices and ICs · 6
On the selection of IGBT devices in soft-switching applications
2002 · A. Consoli, C. Licitra, et al. · PORTO@Iris · 6
Power MOSFET macromodel accounting for temperature dependence: parameter extraction and simulation
2002 · C. Leonardi, F. Frisina, et al. · IEEE ... Workshop on Control and Modeling for Power Electronics · 4
Works count: 31
Citation count: 690
H-index: 15
I10-index: 18
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