Author

Farida Rebib

Observed names: F Rebib, F. Rebib

Institutions: Centre National de la Recherche Scientifique, Institut de Chimie de Clermont-Ferrand, Laboratoire Procédés, Matériaux et Energie Solaire, Université Blaise Pascal

Observed institutions: Centre National de la Recherche Scientifique, Fondazione Bruno Kessler, Institut de Chimie de Clermont-Ferrand, Laboratoire Procédés, Matériaux et Energie Solaire, Université Blaise Pascal, Istituto per la Ricerca Scientifica e Tecnologica

OpenAlex ID: A5086003871

SiOxNy thin films deposited by reactive sputtering: Process study and structural characterisation

2006 · F. Rebib, E. Tomasella, et al. · Thin Solid Films · 45

Investigation of structural and optical properties of sputtered Zirconia thin films

2008 · F. Rebib, N. Laidani, et al. · The European Physical Journal Applied Physics · 32

Structural and Optical Investigations of Silicon Carbon Nitride Thin Films Deposited by Magnetron Sputtering

2009 · Eric Tomasella, Laurent Spinelle, et al. · Plasma Processes and Polymers · 30

FTIR and XPS investigations of a-SiOxNy thin films structure

2008 · F Rebib, E Tomasella, et al. · Journal of Physics Conference Series · 25

Structural and optical investigations of SiOxNy thin films deposited by R.F. sputtering

2005 · F. Rebib, E. Tomasella, et al. · Surface and Coatings Technology · 25

Determination of optical properties of a-SiOxNy thin films by ellipsometric and UV-visible spectroscopies

2008 · F Rebib, E Tomasella, et al. · Journal of Physics Conference Series · 19

Structural and optical properties studies of sputtered a-SiCN thin films

2008 · E Tomasella, F Rebib, et al. · Journal of Physics Conference Series · 19

Optical emission spectroscopy investigation of sputtering discharge used for SiOxNy thin films deposition and correlation with the film composition

2006 · F. Rebib, E. Tomasella, et al. · Applied Surface Science · 13

Effect of composition inhomogeneity in a-SiOxNy thin films on their optical properties

2008 · Farida Rebib, Eric Tomasella, et al. · Optical Materials · 11

Electrical behaviour of SiOxNy thin films and correlation with structural defects

2006 · F. Rebib, E. Tomasella, et al. · Applied Surface Science · 9

Influence of the Structure of a-SiOxNy Thin Films on Their Electrical Properties

2007 · Farida Rebib, Eric Tomasella, et al. · Plasma Processes and Polymers · 6

Influence of Substrate Biasing on the Structural and Electrical Properties of Sputtered Zirconia Thin Films

2009 · Farida Rebib, Angélique Bousquet, et al. · Plasma Processes and Polymers · 3

Mechanical Study of High Resistance Silicon Carbide Based Multi‐Nano‐Layers Grown by Multifrequency PACVD

2009 · Farida Rebib, Thomas Gaudy, et al. · Plasma Processes and Polymers · 3

Study of Reactive RF Sputtering Process of Silicon Target Under ArO2N2 Atmospheres

2007 · Farida Rebib, Eric Tomasella, et al. · Plasma Processes and Polymers · 2

Etude structurale, optique et électrique de couches minces d'oxynitrure de silicium déposées par pulvérisation cathodique radiofréquence réactive

2006 · Farida Rebib · OpenGrey (Institut de l'Information Scientifique et Technique)

Works count: 15

Citation count: 239

H-index: 9

I10-index: 9