Author

O. Polgár

Observed names: O Polgár, O. Polgar, Oliver Polgar

Institutions: Institute for Technical Physics and Materials Science, HUN-REN Research Centre for Natural Sciences

Observed institutions: Institute for Technical Physics and Materials Science, Hungarian Academy of Sciences, HUN-REN Research Centre for Natural Sciences

OpenAlex ID: A5090735013

Characterization of different porous silicon structures by spectroscopic ellipsometry

1996 · M Fried, T Lohner, et al. · Thin Solid Films · 52

High-Speed Imaging/Mapping Spectroscopic Ellipsometry for In-Line Analysis of Roll-to-Roll Thin-Film Photovoltaics

2013 · Ambalanath Shan, Miklos Fried, et al. · IEEE Journal of Photovoltaics · 40

Comparison of algorithms used for evaluation of ellipsometric measurements random search, genetic algorithms, simulated annealing and hill climbing graph-searches

2000 · O. Polgár, M. Fried, et al. · Surface Science · 35

Ellipsometric characterization of damage profiles using an advanced optical model

2003 · P. Petrik, O. Polgár, et al. · Journal of Applied Physics · 31

Expanded beam (macro-imaging) ellipsometry

2010 · M. Fried, G. Juhász, et al. · Thin Solid Films · 26

Non‐collimated beam ellipsometry

2008 · G. Juhász, Z. Horváth, et al. · Physica status solidi. C, Conferences and critical reviews/Physica status solidi. C, Current topics in solid state physics · 25

Ellipsometric characterization of oxidized porous silicon layer structures

2000 · T Lohner, M Fried, et al. · Materials Science and Engineering B · 21

Application of wide angle beam spectroscopic ellipsometry for quality control in solar cell production

2009 · C. Major, G. Juhász, et al. · Vacuum · 18

Wide angle beam ellipsometry for extremely large samples

2008 · C. Major, G. Juhász, et al. · Physica status solidi. C, Conferences and critical reviews/Physica status solidi. C, Current topics in solid state physics · 18

Dose-dependence of ion implantation-caused damage in silicon measured by ellipsometry and backscattering spectrometry

2004 · M. Fried, P. Petrik, et al. · Thin Solid Films · 18

Optimisation of porous silicon based passive optical elements by means of spectroscopic ellipsometry

2003 · J. Volk, M. Fried, et al. · physica status solidi (a) · 18

Comparative study of the oxidation of thin porous silicon layers studied by reflectometry, spectroscopic ellipsometry and secondary ion mass spectroscopy

1998 · M Fried, O Polgár, et al. · Journal of Luminescence · 18

Ellipsometric characterization of nanocrystals in porous silicon

2006 · P. Petrik, M. Fried, et al. · Applied Surface Science · 17

Evaluation strategies for multi-layer, multi-material ellipsometric measurements

2006 · O. Polgár, P. Petrik, et al. · Applied Surface Science · 16

Comparative study of ion implantation caused damage depth profiles in polycrystalline and single crystalline silicon studied by spectroscopic ellipsometry and Rutherford backscattering spectrometry

1999 · P. Petrik, T. Lohner, et al. · Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms · 16