Author

Joachim Zajadacz

Observed names: J Zajadacz, J. Zajadacz, Zajadacz, J.
ORCID: 0000-0003-2151-4193
Observed ORCID: 0000-0003-2151-4193
OpenAlex ID: A5091192861
2010 · Niclas Lindqvist, Qing Liu, et al. · Investigative Ophthalmology & Visual Science · 166
2014 · Christian Steinberg, Khalid Dhima, et al. · Microelectronic Engineering · 35
2010 · Christian Elsner, Joachim Zajadacz, et al. · Microelectronic Engineering · 13
2008 · S. Möllenbeck, N. Bogdanski, et al. · Microelectronic Engineering · 13
2007 · S. Möllenbeck, N. Bogdanski, et al. · Microelectronic Engineering · 13
2024 · Pierre Lorenz, Martin Ehrhardt, et al. · Applied Surface Science · 12
2009 · Christian Elsner, Sergej Naumov, et al. · Thin Solid Films · 12
2007 · S. Möllenbeck, N. Bogdanski, et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 12
2015 · P. Lorenz, J. Zajadacz, et al. · Applied Surface Science · 11
2022 · Pierre Lorenz, Joachim Zajadacz, et al. · Procedia CIRP · 9
2010 · Steffen Kurth, Karla Hiller, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 9
2018 · Stefanie Riedel, Katharina Bela, et al. · Materials & Design · 8
2015 · Joachim Zajadacz, Pierre Lorenz, et al. · Microelectronic Engineering · 8
2009 · C. Patzig, J. Zajadacz, et al. · Applied Physics Letters · 8
2009 · S. Möllenbeck, N. Bogdanski, et al. · Microelectronic Engineering · 7
2019 · Lukas Botsch, Israel Lorite, et al. · ACS Applied Electronic Materials · 6
2018 · Andre Mayer, Wenyang Ai, et al. · Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena · 6
2007 · H.-C. Scheer, N. Bogdanski, et al. · Microelectronic Engineering · 6
2024 · Pierre Lorenz, Joachim Zajadacz, et al. · physica status solidi (a) · 5
2018 · Klaus Zimmer, Joachim Zajadacz, et al. · Applied Surface Science · 5
Works count: 48
Citation count: 480
H-index: 10
I10-index: 11
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