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Ming‐Hsien Lee

Observed names: M.-H. Lee, Ming Hsien Lee, Ming-Hsien Lee
ORCID: 0000-0002-0102-5774
Observed ORCID: 0000-0002-0102-5774
OpenAlex ID: A5091402640
A simple and low-cost method to fabricate TFTs with poly-Si nanowire channel
2005 · H.-C. Lin, M.-H. Lee, et al. · IEEE Electron Device Letters · 77
Reducing Power Consumption of Active-Matrix Mini-LED Backlit LCDs by Driving Circuit
2021 · Ming-Yang Deng, En-Lin Hsiang, et al. · IEEE Transactions on Electron Devices · 44
Fabrication and characterization of nanowire transistors with solid-phase crystallized poly-Si channels
2006 · Horng-Chih Lin, Ming-Hsien Lee, et al. · IEEE Transactions on Electron Devices · 38
Analog PWM Method With Sweep Generation Structure Based on P-Type LTPS TFTs for Micro-LED Displays
2023 · Chih-Lung Lin, Cheng-Han Ke, et al. · IEEE Journal of the Electron Devices Society · 28
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41‐1: Invited Paper: Active Matrix Mini‐LED Backlights for 1000PPI VR LCD
2019 · Yang-En Wu, Ming-Hsien Lee, et al. · SID Symposium Digest of Technical Papers · 23
AM Mini-LED Backlight Driving Circuit Using PWM Method With Power-Saving Mechanism
2022 · Chih-Lung Lin, Yi-Chien Chen, et al. · IEEE Journal of the Electron Devices Society · 22
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Effective density-of-states distribution of polycrystalline silicon thin-film transistors under hot-carrier degradation
2007 · Ming-Hsien Lee, Kai-Hsiang Chang, et al. · Journal of Applied Physics · 17
15.4: Excellent Performance of Indium‐Oxide‐Based Thin‐Film Transistors by DC Sputtering
2009 · Ming‐Hsien Lee, Ching‐Chieh Shih, et al. · SID Symposium Digest of Technical Papers · 16
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Improvement of Memory State Misidentification Caused by Trap-Assisted GIDL Current in a SONOS-TFT Memory Device
2009 · Te-Chih Chen, Ting-Chang Chang, et al. · IEEE Electron Device Letters · 14
78‐1: The Study of Motion Blur Behavior in the Strobe Backlight LCD for Virtual Reality Application
2017 · Chang-Hung Li, Ssu-Hui Lu, et al. · SID Symposium Digest of Technical Papers · 9
17‐1:Invited Paper:An Overview of Solutions for Achieving HDR LCDs
2020 · Jenn-Jia Su, Hsueh-Ying Huang, et al. · SID Symposium Digest of Technical Papers · 7
Charge-Trapping-Induced Parasitic Capacitance and Resistance in SONOS TFTs Under Gate Bias Stress
2011 · Chia-Sheng Lin, Ying-Chung Chen, et al. · IEEE Electron Device Letters · 7
Analysis of Degradation Mechanism in SONOS-TFT Under Hot-Carrier Operation
2010 · Te-Chih Chen, Ting-Chang Chang, et al. · IEEE Electron Device Letters · 7
Spatially and temporally resolving the degradation of n-channel poly-Si thin-film transistors under hot-carrier stressing
2007 · Ming-Hsien Lee, Kai-Hsiang Chang, et al. · Journal of Applied Physics · 6
Spatially resolving the hot carrier degradations of poly-Si thin-film transistors using a novel test structure
2006 · Horng-Chih Lin, Ming-Hsien Lee, et al. · IEEE Electron Device Letters · 5
44.2: 512PPI Mobile Displays with High Aperture Ratio, Slim Border, and High Color Gamut
2014 · Ming‐Hsien Lee, Hsiao‐Wen Wang, et al. · SID Symposium Digest of Technical Papers · 4
A novel methodology for extracting effective density-of-states in poly-Si thin-film transistors
2005 · H.-C. Lin, K.-L. Yeh, et al. · Technical digest - International Electron Devices Meeting/Technical digest · 4
23.4: Delamination Effect on Flexible LTPS‐TFTs
2013 · Ssu‐Hui Lu, Ming‐Hsien Lee, et al. · SID Symposium Digest of Technical Papers · 3
Effect of Lateral Body Terminal on Silicon–Oxide–Nitride–Oxide–Silicon Thin-Film Transistors
2011 · Hung-Wei Li, Ting-Chang Chang, et al. · IEEE Electron Device Letters · 3
22.4: In‐Cell Multiple Ambient Light Sensor (ALSs) LCD Integration Using Si‐based Photonic Sensor by a‐Si TFT Technology
2010 · An‐Thung Cho, Hung‐Wei Tseng, et al. · SID Symposium Digest of Technical Papers · 2
Determination of Effective Density-of-States Using a Novel Schottky Barrier Poly-Si Thin-Film Transistor
2005 · Horng-Chih Lin, Ming-Hsien Lee, et al. · Electrochemical and Solid-State Letters · 2
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16.1: Distinguished Paper : Rollable Electrophoretic Display with Amorphous‐Silicon Gate Driver Circuit Integrated
2011 · Chao‐Chien Chiu, Yuan‐Jun Hsu, et al. · SID Symposium Digest of Technical Papers · 1
Unusual Threshold Voltage Shift Caused by Self-Heating-Induced Charge Trapping Effect
2010 · Fu-Yen Jian, Ting-Chang Chang, et al. · Electrochemical and Solid-State Letters · 1
Spatially resolving the degradation of SPC thin-film transistors under AC stress
2007 · Kai-Hsiang Chang, Ming-Hsien Lee, et al. · International Semiconductor Device Research Symposium
High performance P-channel schottky barrier thin-film transistors with PtSi source/drain
2005 · Ming‐Hsien Lee, Tiao Huang, et al.
Works count: 26
Citation count: 340
H-index: 9
I10-index: 9
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