Author

Octavian Ligor

Observed names: Ligor Octavian, Ligor, Octavian, O Ligor, O. Ligor

Institution: National Institute for Research and Development in Microtechnologies

Observed institutions: Centre National de la Recherche Scientifique, Toyohashi University of Technology, University of Bucharest, Laboratoire d'Analyse et d'Architecture des Systèmes, Université de Lyon, University of Michigan, Institut des Nanotechnologies de Lyon, National Institute for Laser Plasma and Radiation Physics, National Institute for Research and Development in Microtechnologies, Université de Toulouse, Institut National des Sciences Appliquées de Lyon

ORCID: 0000-0002-1975-7965

Observed ORCID: 0000-0002-1975-7965

OpenAlex ID: A5091620111

Type-II band alignment of low-boron-content BGaN/GaN heterostructures

2019 · J Mickevičius, M Andrulevicius, et al. · Journal of Physics D Applied Physics · 11

Influence of electron irradiation and rapid thermal annealing on photoluminescence from GaAsNBi alloys

2020 · E.-M. Pavelescu, O. Ligor, et al. · Applied Physics Letters · 8

Electromodulation spectroscopy of heavy-hole, light-hole, and spin-orbit transitions in GaAsBi layers at hydrostatic pressure

2017 · F. Dybała, J. Kopaczek, et al. · Applied Physics Letters · 7

Interpretation of scanning capacitance microscopy for thin oxides characterization

2009 · O. Ligor, B. Gautier, et al. · Thin Solid Films · 7

Field-effect transistors based on nickel oxide doped with nitrogen semiconductor ferroelectrics for ultralow voltage switch (1 μV), low subthreshold swing and memory

2025 · S Vulpe, M Dragoman, et al. · Nanotechnology · 3

Polymer thin film refractive index determination

2005 · V. Damian, P.C. Logofatu, et al. · CAS proceedings · 2

Electric field–induced tunable insulator-to-metal transition at room temperature in NiO/ferroelectric heterostructures

2025 · M Dragoman, S Vulpe, et al. · Nanotechnology · 1

Morpho-Structural and Electrical Properties of TNO Layers Deposited by the Magnetron Sputtering Co-Deposition Method

2025 · Nicoleta Vasile, Cosmin Romanitan, et al. · CAS proceedings · 1

Enhancement in photoluminescence from GaPAsN/GaP alloys by 6-MeV electrons irradiation and rapid thermal annealing

2024 · E.-M. Pavelescu, D. Ticoş, et al. · Optical Materials · 1

Nanoscale Characterization Of Ultra-Thin Dielectrics Using Scanning Capacitance Microscopy

2009 · O. Ligor, B. Gautier, et al. · AIP conference proceedings · 1

Electric gate control of Schottky ferroelectric Pt/ZrO2/Pt/n-Si/Al three-terminal devices

2026 · Mircea Dragoman, Silviu Vulpe, et al. · Applied Physics A

An empirical study of nanocrystalline graphite’s morpho-structural and electrical properties as a function of substrate temperature during PECVD synthesis

2023 · O. -G. Simionescu, O. Brîncoveanu, et al. · CAS proceedings

Metrology issues in the measurement of very small currents and capacitances by atomic force microscopy

2014 · Gautier, Brice, Grandfond, Antonin, et al. · HAL

Mesure et cartographie à l’échelle nanométrique des propriétés ferroélectriques et diélectriques des couches minces par les techniques dérivées de la microscopie à force atomique

2011 · B. Gautier, A. Brugere, et al. · Matériaux & Techniques

Reliability of the Scanning Capacitance Microscopy and Spectroscopy for the nanoscale characterization of semiconductors and dielectrics

2010 · O. Ligor · OpenGrey (Institut de l'Information Scientifique et Technique)

Integrated polymeric Mach Zehnder interferometer for biosensing applications

2005 · R. Muller, D. Esinenco, et al. · CAS proceedings

Investigations on phosphosilicate glass by using IR, AFM and cluster model calculation

2003 · M. Bercu, C. Moldovan, et al. · CAS proceedings

Works count: 17

Citation count: 42

H-index: 4

I10-index: 1