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Gui Xia Dong

SIMS quantification of Si 1− x Ge x alloys using polyatomic secondary ions
2001 · Gui Dong, Cha Liangzhen, et al. · Surface and Interface Analysis · 14
UBM integrity studies on copper/low-k dielectrics for fine pitch flip chip packaging
2004 · Seung Wook Yoon, V. Kripesh, et al. · IEEE Electronic Components and Technology Conference (ECTC) · 12
Relationship between Diamond Particle Size and Thermal Conductivity of Cu-Diamond Composites
2014 · Gui Xia Dong, Qiu Xiang Liu, et al. · Advanced materials research · 4
Research on Properties of AlN-Mo Composite Ceramic
2012 · Jie Kang, Gui Xia Dong, et al. · Advanced materials research · 3
A New Failure Analysis Flow of Gate Oxide Integrity Failure in Wafer Fabrication
2009 · Hua Younan, Chu Susan, et al. · Proceedings - International Symposium for Testing and Failure Analysis · 2
Preparation and Investigation on Properties of the MgTiO3-CaTiO3 Microwave Ceramic Materials
2014 · Li Dong, Gui Xia Dong, et al. · Advanced materials research · 1
Effect of CNTs Content on Properties of AlN-CNTs Composite Ceramic
2013 · Qiu Xiang Liu, Gui Xia Dong, et al. · Advanced materials research · 1
Annealing on the Electrical and Dielectric Properties of Barium Strontium Titanate
2011 · Gui Xia Dong, Wei Liu · Advanced materials research · 1
TOF-SIMS depth profiling of SIMON
2002 · Ge Xin, Gui Dong, et al. · Applied Surface Science · 1
Effect of Sintering Temperatures and Ba/Ti Ratio on Dielectric Properties of BaTiO3 Ceramic
2013 · Yuan Yuan Li, Gui Xia Dong, et al. · Advanced materials research
Analysis of Airborne Boron and Phosphorus Contaminations on Wafer Surface by TOF-SIMS
2006 · Mo Zhiqiang, Gui Dong, et al. · IEEE International Conference on Semiconductor Electronics
Works count: 11
Citation count: 39
H-index: 3
I10-index: 2
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