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Yuejian Wu

Observed names: Wu Yuejian, Wu, Yuejian
Institution: Shandong University
ORCID: 0009-0007-8127-6437
Observed ORCID: 0009-0007-8127-6437
OpenAlex ID: A5102072375
800G DSP ASIC Design Using Probabilistic Shaping and Digital Sub-Carrier Multiplexing
2020 · Han Sun, Mehdi Torbatian, et al. · Journal of Lightwave Technology · 292
Diagnosis of scan chain failures
2002 · Yuejian Wu · Proceedings · 91
Scan-based BIST fault diagnosis
1999 · Yuejian Wu, S.M.I. Adham · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 59
BIST fault diagnosis in scan-based VLSI environments
2002 · Yuejian Wu, S. Adham · IEEE International Test Conference (ITC) · 39
Testing asics with multiple identical cores
2003 · Yuejian Wu, P. MacDonald · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 33
Novel 16QAM carrier recovery based on blind phase search
2014 · Han Sun, Kuang-Tsan Wu, et al. · European Conference on Optical Communication · 22
Fast detection of data retention faults and other SRAM cell open defects
2005 · Josh Yang, Baosheng Wang, et al. · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 21
Built-in self-test for multi-port RAMs
2002 · Yuejian Wu, S. Gupta · Proceedings - Asian Test Symposium/Proceedings · 19
Low power decoding of BCH codes
2004 · Yuejian Wu · IEEE International Symposium on Circuits and Systems proceedings · 18
Low power clocking strategies in deep submicron technologies
2008 · M. Samy Hosny, Yuejian Wu · IEEE International Conference on IC Design and Technology (ICICDT) · 17
Dense Hybrid Proposal Modulation for Lane Detection
2023 · Yuejian Wu, Linqing Zhao, et al. · IEEE Transactions on Circuits and Systems for Video Technology · 13
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Low Power SoC Memory BIST
2006 · Yuejian Wu, Andre Ivanov · Proceedings · 11
Accelerated path delay fault simulation
2003 · Yuejian Wu, A. Ivanov · IEEE VLSI Test Symposium (VTS) · 11
Single-reference multiple intermediate signature (SREMIS) analysis for BIST
1995 · Yuejian Wu, A. Ivanov · IEEE Transactions on Computers · 11
Built-In Functional Tests for Silicon Validation and System Integration of Telecom SoC Designs
2009 · Yuejian Wu, Sandy Thomson, et al. · IEEE Transactions on Very Large Scale Integration (VLSI) Systems · 9
Free Razor: A Novel Voltage Scaling Low-Power Technique for Large SoC Designs
2014 · Yuejian Wu, Sandy Thomson, et al. · IEEE Transactions on Very Large Scale Integration (VLSI) Systems · 8
854 Gb/s Superchannel InP Transmitter and Receiver Photonic Integrated Circuits utilizing Real-Time Detection of PM-8QAM
2012 · David Krause, Han Sun, et al. · Optical Fiber Communication Conference · 7
A Fast Diagnosis Scheme for Distributed Small Embedded SRAMs
2005 · Baosheng Wang, Yuejian Wu, et al. · Design, Automation, and Test in Europe · 6
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Reducing hardware with fuzzy multiple signature analysis
1995 · Yuejian Wu, A. Ivanov · IEEE Design & Test of Computers · 6
Promising DSP Techniques to Increase Long Haul Transmission Capacity
2023 · Domaniç Lavery, Siddharth Varughese, et al. · Optical Fiber Communication Conference · 5
A retention-aware test power model for embedded SRAM
2005 · Baosheng Wang, J. Yang, et al. · Asia and South Pacific Design Automation Conference (ASP-DAC) · 5
Minimal hardware multiple signature analysis for BIST
2002 · Yuejian Wu, A. Ivanov · IEEE VLSI Test Symposium (VTS) · 5
Interconnect delay fault testing with IEEE 1149.1
1999 · Yuejian Wu, Paul Soong · IEEE International Test Conference (ITC) · 4
Data-driven robust optimization scheduling model for multi-area interconnected power grid
2025 · Shunxiang Yu, Xiaoming Dong, et al. · International Journal of Electrical Power & Energy Systems · 3
Design and test of a 9-port SRAM for a 100 Gb/s STS-1 switch
2003 · R. Gibbins, R.D. Adams, et al. · Records of the IEEE International Workshop on Memory Technology, Design, and Testing · 3
Works count: 39
Citation count: 731
H-index: 11
I10-index: 14
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