Work

Built-in self-test for multi-port RAMs

Year: 2002

Type: conference-paper

Source: Proceedings - Asian Test Symposium/Proceedings

DOI: 10.1109/ats.1997.643989

Authors: Yuejian Wu, S. Gupta

Institution: Nortel (Canada)

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2160465664

FWCI: 2.007

Cites: 9

Cited by: 19

Related to: 10