Author

Kookjin Lee

Observed name: Lee, Kookjin

Observed institutions: Intel (United States), Sandia National Laboratories California, Yonsei University, Korea University, Sandia National Laboratories, IMEC, Arizona State University, KU Leuven

ORCID: 0000-0002-9896-1090

Observed ORCID: 0000-0002-9896-1090

OpenAlex ID: A5102724635

Understanding tunable photoresponsivity of two-dimensional multilayer phototransistors: Interplay between thickness and carrier mobility

2020 · Young-Sun Moon, Ji Hoon Shon, et al. · Applied Physics Letters · 21

Hot-Electron-Induced Punch-Through (HEIP) Effect in p-MOSFET Enhanced by Mechanical Stress

2021 · Kookjin Lee, Ben Kaczer, et al. · IEEE Electron Device Letters · 18

Gate-Induced-Drain-Leakage (GIDL) in CMOS Enhanced by Mechanical Stress

2022 · Kookjin Lee, Ben Kaczer, et al. · IEEE Transactions on Electron Devices · 15

Modeling and Understanding the Compact Performance of h‐BN Dual‐Gated ReS2 Transistor

2021 · Kookjin Lee, Junhee Choi, et al. · Advanced Functional Materials · 15

Transfer of transition-metal dichalcogenide circuits onto arbitrary substrates for flexible device applications

2019 · Hyebin Lee, Kookjin Lee, et al. · Nanoscale · 14

Parameterized Neural Ordinary Differential Equations: Applications to Computational Physics Problems

2020 · Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States), Kookjin Lee, et al. · OSTI OAI (U.S. Department of Energy Office of Scientific and Technical Information) · 12

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Detection and Accurate Classification of Mixed Gases Using Machine Learning with Impedance Data

2020 · Kookjin Lee, Sangjin Nam, et al. · Advanced Theory and Simulations · 12

Real-time effect of electron beam on MoS 2 field-effect transistors

2020 · Kookjin Lee, Hyebin Lee, et al. · Nanotechnology · 12

Multiple machine learning approach to characterize two-dimensional nanoelectronic devices via featurization of charge fluctuation

2021 · Kookjin Lee, Sangjin Nam, et al. · npj 2D Materials and Applications · 11

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Unsupervised physics-informed disentanglement of multimodal data for high-throughput scientific discovery

2022 · Trask, Nathaniel, Martinez, Carianne, et al. · arXiv (Cornell University) · 9

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Cyclic Thermal Effects on Devices of Two‐Dimensional Layered Semiconducting Materials

2021 · Yeonsu Kim, Ben Kaczer, et al. · Advanced Electronic Materials · 8

Experiment on the flammability variation of micron-sized aluminum powder depending on combustion environment for burning of aluminum-diluted oxygen

2020 · Taeho Ko, Wando Ki, et al. · Acta Astronautica · 7

Defect spectroscopy of sidewall interfaces in gate-all-around silicon nanosheet FET

2020 · Kookjin Lee, Yeonsu Kim, et al. · Nanotechnology · 5

Classifiable Limiting Mass Change Detection in a Graphene Resonator Using Applied Machine Learning

2022 · Miri Seo, Eunseo Yang, et al. · ACS Applied Electronic Materials · 4

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Metal-Contact Improvement in a Multilayer WSe2 Transistor through Strong Hot Carrier Injection

2021 · Kookjin Lee, Yeonsu Kim, et al. · ACS Applied Materials & Interfaces · 4

Predictive Skill of Deep Learning Models Trained on Limited Sequence Data

2020 · Sandia National Laboratories (SNL-CA), Livermore, CA (United States), Kookjin Lee, et al. · OSTI OAI (U.S. Department of Energy Office of Scientific and Technical Information) · 3

Meta-learning Structure-Preserving Dynamics

2025 · Jing, Cheng, Mudiyanselage, Uvini Balasuriya, et al. · arXiv (Cornell University) · 2

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PDEfuncta: Spectrally-Aware Neural Representation for PDE Solution Modeling

2025 · Minju Jo, Woojin Cho, et al. · neural information processing systems · 2

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Impact of Externally Induced Local Mechanical Stress on Electrical Performance of Decananometer MOSFETs

2022 · Kookjin Lee, Ben Kaczer, et al. · IEEE Transactions on Electron Devices · 2

Significant Enhancement of HCD and TDDB in CMOS FETs by Mechanical Stress

2022 · Kookjin Lee, Ben Kaczer, et al. · IEEE International Reliability Physics Symposium proceedings · 2

Extending Fourier Neural Operators for Modeling Parameterized and Coupled PDEs

2026 · Jing, Cheng, Mudiyanselage, Uvini Balasuriya, et al. · arXiv (Cornell University) · 1

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Deep Understanding of Electron Beam Effects on 2D Layered Semiconducting Devices Under Bias Applications

2022 · Kookjin Lee, Hyunjin Ji, et al. · Advanced Materials Interfaces · 1

Large-Scale Flight Frequency Optimization with Global Convergence in the US Domestic Air Passenger Markets

2021 · Jinsung Jeon, Dongeun Lee, et al. · Society for Industrial and Applied Mathematics eBooks · 1

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Study of Aluminum Agglomeration Model During Solid Propellant Combustion

2019 · Jisang Yoon, Kookjin Lee, et al. · Journal of the Korean Society of Propulsion Engineers · 1

Investigation of optimal peening intensity of gear with stress concentration for improvement of fatigue life

2005 · Dongsun Lee, Kookjin Lee, et al. · Proceedings of the KSME Conference · 1

Works count: 32

Citation count: 183

H-index: 9

I10-index: 9