Author

Yuji Kohno

Observed names: Y Kohno, Y. Kohno

Institution: JEOL (Japan)

Observed institution: JEOL (Japan)

ORCID: 0009-0002-7863-1833

Observed ORCID: 0009-0002-7863-1833

OpenAlex ID: A5102753699

Differential phase-contrast microscopy at atomic resolution

2012 · Naoya Shibata, Scott D. Findlay, et al. · Nature Physics · 478

Electric field imaging of single atoms

2017 · Naoya Shibata, Takehito Seki, et al. · Nature Communications · 205

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Imaging of built-in electric field at a p-n junction by scanning transmission electron microscopy

2015 · Naoya Shibata, Scott D. Findlay, et al. · Scientific Reports · 160

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New area detector for atomic-resolution scanning transmission electron microscopy

2010 · N. Shibata, Y. Kohno, et al. · Journal of Electron Microscopy · 146

Direct electric field imaging of graphene defects

2018 · Ryo Ishikawa, Scott D. Findlay, et al. · Nature Communications · 117

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Direct observation of Σ7 domain boundary core structure in magnetic skyrmion lattice

2016 · Takao Matsumoto, Yeong-Gi So, et al. · Science Advances · 117

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Real-space visualization of intrinsic magnetic fields of an antiferromagnet

2022 · Yuji Kohno, Takehito Seki, et al. · Nature · 109

Performance of low-voltage STEM/TEM with delta corrector and cold field emission gun

2010 · T. Sasaki, H. Sawada, et al. · Journal of Electron Microscopy · 103

Direct Visualization of Local Electromagnetic Field Structures by Scanning Transmission Electron Microscopy

2017 · Naoya Shibata, Scott D. Findlay, et al. · Accounts of Chemical Research · 98

Atomic resolution electron microscopy in a magnetic field free environment

2019 · N. Shibata, Y. Kohno, et al. · Nature Communications · 93

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Attainment of 40.5 pm spatial resolution using 300 kV scanning transmission electron microscope equipped with fifth-order aberration corrector

2017 · Shigeyuki Morishita, Ryo Ishikawa, et al. · Microscopy · 83

Performances of an 80–200 kV microscope employing a cold-FEG and an aberration-corrected objective lens

2012 · Christian Ricolleau, Jaysen Nelayah, et al. · Microscopy · 65

Probing the Internal Atomic Charge Density Distributions in Real Space

2018 · Gabriel Sánchez-Santolino, Nathan R. Lugg, et al. · ACS Nano · 60

Direct imaging of local atomic structures in zeolite using optimum bright-field scanning transmission electron microscopy

2023 · Kousuke Ooe, Takehito Seki, et al. · Science Advances · 58

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Enhanced light element imaging in atomic resolution scanning transmission electron microscopy

2013 · S.D. Findlay, Y. Kohno, et al. · Ultramicroscopy · 45

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Development of tilt-scan system for differential phase contrast scanning transmission electron microscopy

2022 · Yuji Kohno, Akiho Nakamura, et al. · Microscopy · 41

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Stable Magnetic Skyrmion States at Room Temperature Confined to Corrals of Artificial Surface Pits Fabricated by a Focused Electron Beam

2018 · Takao Matsumoto, Yeong-Gi So, et al. · Nano Letters · 39

Jointed magnetic skyrmion lattices at a small-angle grain boundary directly visualized by advanced electron microscopy

2016 · Takao Matsumoto, Yeong-Gi So, et al. · Scientific Reports · 33

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Nanoscale electromagnetic field imaging by advanced differential phase-contrast STEM

2024 · Satoko Toyama, Takehito Seki, et al. · Nature Reviews Electrical Engineering · 24

Evaluation of residual aberration in fifth-order geometrical aberration correctors

2018 · Shigeyuki Morishita, Yuji Kohno, et al. · Microscopy · 23

Differential Phase Contrast Imaging with Reduced Dynamical Diffraction Effect

2017 · Akiho Nakamura, Yuji Kohno, et al. · Microscopy and Microanalysis · 22

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Automated geometric aberration correction for large-angle illumination STEM

2021 · Ryo Ishikawa, Riku Tanaka, et al. · Ultramicroscopy · 14

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Annular Bright-Field Scanning Transmission Electron Microscopy: Direct and Robust Atomic-Resolution Imaging of Light Elements in Crystalline Materials

2017 · Scott D. Findlay, Naoya Shibata, et al. · Microscopy Today · 14

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Resolution Achievement of 40.5 pm in Scanning Transmission Electron Microscopy using 300 kV Microscope with Delta Corrector

2018 · Shigeyuki Morishita, Ryo Ishikawa, et al. · Microscopy and Microanalysis · 10

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Magnetic field observation in a magnetic tunnel junction by scanning transmission electron microscopy

2023 · Yuji Kohno, Takehito Seki, et al. · Microscopy · 9

Works count: 46

Citation count: 2,196

H-index: 21

I10-index: 24