Work

Performance of low-voltage STEM/TEM with delta corrector and cold field emission gun

Year: 2010

Type: article

Source: Journal of Electron Microscopy

DOI: 10.1093/jmicro/dfq027

Authors: T. Sasaki, H. Sawada, F. Hosokawa, Y. Kohno, T. Tomita, T. Kaneyama, Y. Kondo, K. Kimoto, Y. Sato, K. Suenaga

Institutions: JEOL (Japan), Japan Science and Technology Agency, National Institute for Materials Science, National Institute of Advanced Industrial Science and Technology

Language: English

Topic: Advanced Electron Microscopy Techniques and Applications

Subfield: Structural Biology

Field: Biochemistry, Genetics and Molecular Biology

Domain: Life Sciences

Open Access status: closed

OpenAlex ID: W2148147181

FWCI: 3.885

Cites: 14

Cited by: 103

Related to: 10