Author

T. Kaneyama

Observed names: T Kaneyama, Toshikatsu KANEYAMA, Toshikatsu Kaneyama, 金山俊克

Observed institutions: Tokyo Institute of Technology, JEOL (Japan), Lawrence Berkeley National Laboratory, Tohoku University, Japan Science and Technology Agency, Sumitomo Metal Mining (Japan)

OpenAlex ID: A5110099337

STEM imaging of 47-pm-separated atomic columns by a spherical aberration-corrected electron microscope with a 300-kV cold field emission gun

2009 · H. Sawada, Y. Tanishiro, et al. · Journal of Electron Microscopy · 167

Visualizing and identifying single atoms using electron energy-loss spectroscopy with low accelerating voltage

2009 · Kazu Suenaga, Yuta Sato, et al. · Nature Chemistry · 166

Performance of low-voltage STEM/TEM with delta corrector and cold field emission gun

2010 · T. Sasaki, H. Sawada, et al. · Journal of Electron Microscopy · 103

Direct imaging of lithium atoms in LiV2O4 by spherical aberration-corrected electron microscopy

2010 · Yoshifumi Oshima, Hidetaka Sawada, et al. · Microscopy · 101

Measurement method of aberration from Ronchigram by autocorrelation function

2008 · H. Sawada, T. Sannomiya, et al. · Ultramicroscopy · 90

Correction of higher order geometrical aberration by triple 3-fold astigmatism field

2009 · H. Sawada, T. Sasaki, et al. · Journal of Electron Microscopy · 77

High energy-resolution electron energy-loss spectroscopy study of the dielectric properties of bulk and nanoparticle LaB6 in the near-infrared region

2011 · Yohei Sato, Masami Terauchi, et al. · Ultramicroscopy · 65

Achieving 63 pm Resolution in Scanning Transmission Electron Microscope with Spherical Aberration Corrector

2007 · Hidetaka Sawada, Fumio Hosokawa, et al. · Japanese Journal of Applied Physics · 64

The development of a 200kV monochromated field emission electron source

2014 · Masaki Mukai, Judy S. Kim, et al. · Ultramicroscopy · 46

Higher-order aberration corrector for an image-forming system in a transmission electron microscope

2010 · H. Sawada, T. Sasaki, et al. · Ultramicroscopy · 46

Counting lithium ions in the diffusion channel of an LiV2O4 crystal

2011 · Soyeon Lee, Yoshifumi Oshima, et al. · Journal of Applied Physics · 32

Quantitative annular dark-field STEM images of a silicon crystal using a large-angle convergent electron probe with a 300-kV cold field-emission gun

2011 · S. Kim, Y. Oshima, et al. · Journal of Electron Microscopy · 32

Identification of Lattice Defects by Convergent-Beam Electron Diffraction

1991 · Michiyoshi Tanaka, Masami Terauchi, et al. · Journal of Electron Microscopy · 32

Detection of arsenic dopant atoms in a silicon crystal using a spherical aberration corrected scanning transmission electron microscope

2010 · Y. Oshima, Y. Hashimoto, et al. · Physical Review B · 29

Design and testing of Omega mode imaging energy filters at 200 kV

1997 · K. Tsuno, T. Kaneyama, et al. · Journal of Electron Microscopy · 29

Development of a monochromator for aberration-corrected scanning transmission electron microscopy

2015 · Masaki Mukai, Eiji Okunishi, et al. · Microscopy · 26

Field emission ultrahigh-resolution analytical electron microscope

1994 · T. Honda, T. Tomita, et al. · Ultramicroscopy · 21

Nanoanalysis by a high‐resolution energy filtering transmission electron microscope

2004 · Masanori Mitome, Yoshio Bando, et al. · Microscopy Research and Technique · 18

A Double Silicon Drift Type Detector System for EDS with Ultrahigh Efficiency and Throughput for TEM

2014 · S. Kawai, I. Onishi, et al. · Microscopy and Microanalysis · 17

Design of omega mode imaging energy filters

1999 · K Tsuno, T Kaneyama, et al. · Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment · 17

Observation of lattice fringes in convergent-beam electron diffraction patterns

1994 · Masami Terauchi, Kenji Tsuda, et al. · Ultramicroscopy · 14

Evaluation of probe size in STEM imaging at 30 and 60kV

2011 · Takeo Sasaki, Hidetaka Sawada, et al. · Micron · 13

Electron microscopy at a sub-50 pm resolution

2011 · K. Takayanagi, S. Kim, et al. · Microscopy · 13

Performance of a Monochromator for a 200 kV Analytical Electron Microscope

2007 · M Mukai, W Inami, et al. · Microscopy and Microanalysis · 13

Monochromator for a 200 kV Analytical Electron Microscope

2006 · M Mukai, W Inami, et al. · Microscopy and Microanalysis · 12

Works count: 79

Citation count: 1,340

H-index: 18

I10-index: 27