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F. Hosokawa

Observed names: F Hosokawa, F.Hosokawa
OpenAlex ID: A5113373881
Visualization of Light Elements at Ultrahigh Resolution by STEM Annular Bright Field Microscopy
2009 · E Okunishi, I Ishikawa, et al. · Microscopy and Microanalysis · 211
STEM imaging of 47-pm-separated atomic columns by a spherical aberration-corrected electron microscope with a 300-kV cold field emission gun
2009 · H. Sawada, Y. Tanishiro, et al. · Journal of Electron Microscopy · 167
Performance of low-voltage STEM/TEM with delta corrector and cold field emission gun
2010 · T. Sasaki, H. Sawada, et al. · Journal of Electron Microscopy · 103
Measurement method of aberration from Ronchigram by autocorrelation function
2008 · H. Sawada, T. Sannomiya, et al. · Ultramicroscopy · 90
Correction of higher order geometrical aberration by triple 3-fold astigmatism field
2009 · H. Sawada, T. Sasaki, et al. · Journal of Electron Microscopy · 77
Atomic-Resolution STEM Imaging of Graphene at Low Voltage of 30 kV with Resolution Enhancement by Using Large Convergence Angle
2015 · H. Sawada, T. Sasaki, et al. · Physical Review Letters · 59
Higher-order aberration corrector for an image-forming system in a transmission electron microscope
2010 · H. Sawada, T. Sasaki, et al. · Ultramicroscopy · 46
A spherical aberration-corrected 200 kV TEM
2003 · F. Hosokawa · Journal of Electron Microscopy · 36
Electron microscopy at a sub-50 pm resolution
2011 · K. Takayanagi, S. Kim, et al. · Microscopy · 13
Applications of a Cs Corrected HRTEM in Materials Science
2002 · J.L. Hutchison, J.M. Titchmarsh, et al. · Microscopy and Microanalysis · 9
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Resolving 45 pm with 300 kV Aberration Corrected STEM
2014 · H. Sawada, N. Shimura, et al. · Microscopy and Microanalysis · 4
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Aberration Corrected Zernike Phase Contrast TEM
2012 · H. Iijima, S. Motoki, et al. · Microscopy and Microanalysis · 4
Performance and Application of Chromatic/Spherical Aberration-Corrected 30 kV Transmission Electron Microscope
2011 · T Sasaki, H Sawada, et al. · Microscopy and Microanalysis · 4
Chromatic Aberration Correction by Combination Concave Lens
2010 · H Sawada, F Hosokawa, et al. · Microscopy and Microanalysis · 4
Determination of the effective source from its image in the backfocal plane of the objective lens
1991 · F. Hosokawa, M. Suzuki, et al. · Ultramicroscopy · 4
The Development of Ultra-high Vacuum Cs-Corrected Scanning Transmission Electron Microscope for Fast Fabrication of Desired Nanostructures
2006 · K Furuya, K Mitsuishi, et al. · Microscopy and Microanalysis · 3
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Performance of R005 Microscope and Aberration Correction System
2009 · H. Sawada, F. Hosokawa, et al. · Springer eBooks · 2
200 kV TEM with a Zernike Phase Plate
2005 · S Motoki, F Hosokawa, et al. · Microscopy and Microanalysis · 2
Development of Phase Contrast Scanning Transmission Electron Microscopy
2015 · H. Iijima, H. Minoda, et al. · Microscopy and Microanalysis · 1
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Advantage of Cc/Cs-corrected Imaging in 30 kV Transmission Electron Microscopy
2012 · T. Sasaki, H. Sawada, et al. · Microscopy and Microanalysis · 1
Development of 30-kV Cc/Cs Correction Tandem System
2011 · H Sawada, F Hosokawa, et al. · Microscopy and Microanalysis · 1
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Highly Stable 300kV Cold Field Emission Gun for 50pm Resolution Electron Microscopy
2009 · T Tomita, Y Tanishiro, et al. · Microscopy and Microanalysis · 1
Correction of Spherical Aberration and Six-Fold Astigmatism Using Three Dodecapoles,
2009 · H Sawada, T Sasaki, et al. · Microscopy and Microanalysis · 1
Auto-Adjustment of Aberration Correction and Experimental Evaluation of R005 Microscope
2008 · S Sawada, F Hosokawa, et al. · Microscopy and Microanalysis · 1
Active-Site Imaging in Catalyst of Au Nanoparticle on Rutile-TiO2 by Combination of Aberration-Corrected TEM and Gas Inlet TEM Holder
2007 · T Tanaka, M Ando, et al. · Microscopy and Microanalysis · 1
Works count: 44
Citation count: 848
H-index: 9
I10-index: 9
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