Author

T. Tomita

Observed name: T Tomita

Institution: JEOL (Japan)

Observed institutions: JEOL (Japan), Japan Science and Technology Agency

OpenAlex ID: A5108901796

Performance of low-voltage STEM/TEM with delta corrector and cold field emission gun

2010 · T. Sasaki, H. Sawada, et al. · Journal of Electron Microscopy · 103

Measurement method of aberration from Ronchigram by autocorrelation function

2008 · H. Sawada, T. Sannomiya, et al. · Ultramicroscopy · 90

Field emission ultrahigh-resolution analytical electron microscope

1994 · T. Honda, T. Tomita, et al. · Ultramicroscopy · 21

Electron microscopy at a sub-50 pm resolution

2011 · K. Takayanagi, S. Kim, et al. · Microscopy · 13

Performance of a Monochromator for a 200 kV Analytical Electron Microscope

2007 · M Mukai, W Inami, et al. · Microscopy and Microanalysis · 13

Monochromator for a 200 kV Analytical Electron Microscope

2006 · M Mukai, W Inami, et al. · Microscopy and Microanalysis · 12

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Development of An 0.2eV Energy Resolution Analytical Electron Microscope

2002 · M. Tanaka, M. Terauchi, et al. · Microscopy and Microanalysis · 12

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Performance of a new Monochromator for a 200 kV Analytical Electron Microscope

2005 · M Mukai, T Kaneyama, et al. · Microscopy and Microanalysis · 8

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The Aberration Corrected JEM-2200FS at Brookhaven

2005 · Y Zhu, R F Klie, et al. · Microscopy and Microanalysis · 4

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Quantitative Electron Holographic Analysis of Electric Potential Distribution around FEG-Emitters

2007 · J. J. Kim, W. X. Xia, et al. · MATERIALS TRANSACTIONS · 3

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Performance of R005 Microscope and Aberration Correction System

2009 · H. Sawada, F. Hosokawa, et al. · Springer eBooks · 2

Development of Field-Emission Gun for High-Voltage Electron Microscope

1990 · T. Tomita, S. Katoh, et al. · Proceedings annual meeting Electron Microscopy Society of America · 2

Highly Stable 300kV Cold Field Emission Gun for 50pm Resolution Electron Microscopy

2009 · T Tomita, Y Tanishiro, et al. · Microscopy and Microanalysis · 1

Correction of Spherical Aberration and Six-Fold Astigmatism Using Three Dodecapoles,

2009 · H Sawada, T Sasaki, et al. · Microscopy and Microanalysis · 1

Auto-Adjustment of Aberration Correction and Experimental Evaluation of R005 Microscope

2008 · S Sawada, F Hosokawa, et al. · Microscopy and Microanalysis · 1

Electron Holography of Advanced Nanomaterials

2006 · Daisuke Shindo, H.S. Park, et al. · Han-guk hyeonmigyeong hakoeji/Applied microscopy · 1

Evaluation of Electric Potential Distribution near FEG-Emitter by Electron Holography

2005 · T Oikawa, T Tomita, et al. · Microscopy and Microanalysis · 1

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A newly developed 200-kV analytical electron microscope

1984 · T. Tomita, M. Iwatsuki, et al. · Proceedings annual meeting Electron Microscopy Society of America · 1

Performance and Application of an Aberration Corrected Analytical Electron Microscope with a Cold Field Emission Gun

2011 · Y Kohno, E Okunishi, et al. · Microscopy and Microanalysis

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Performance of Low-voltage Electron Microscope with New Aberration Correction System and Cold Field Emission Gun

2009 · T Sasaki, H Sawada, et al. · Microscopy and Microanalysis

Development of Spherical Aberration Corrected 300kV FETEM

2007 · H Sawada, F Hosokawa, et al. · Microscopy and Microanalysis

“Mirai-21” Analytical Electron Microscope - Performance Of The Monochromator

2003 · M. Mukai, T. Kaneyama, et al. · Microscopy and Microanalysis

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A 200kV Comprehensive Analytical Electron Microscope

1996 · T. Tomita, M. Kawasaki, et al. · Proceedings annual meeting Electron Microscopy Society of America

Stem Dark-Field Image Using A 200-kV AEM

1996 · T. Tomita, T. Honda, et al. · Proceedings annual meeting Electron Microscopy Society of America

The information limit of a 200kv field emission TEM

1995 · T. Kaneyama, M. Kawasaki, et al. · Proceedings annual meeting Electron Microscopy Society of America

Works count: 29

Citation count: 289

H-index: 8

I10-index: 7