Author

Scott Hayes

Observed institution: Motorola (United States)
OpenAlex ID: A5103589290
2007 · Beth Keser, Craig Amrine, et al. · IEEE Electronic Components and Technology Conference (ECTC) · 113
2004 · Jin-Wook Jang, Scott Hayes, et al. · Journal of Applied Physics · 32
2008 · Lakshmi N. Ramanathan, Beth Keser, et al. · IEEE Electronic Components and Technology Conference (ECTC) · 12
2007 · Beth Keser, Craig Amrine, et al. · IEEE Bipolar/BiCMOS Circuits and Technology Meeting (BCTM) · 5
2013 · Michael Vincent, Doug Mitchell, et al. · IMAPSource Proceedings · 4
2013 · Scott Hayes, Tony Gong, et al. · Additional Conferences (Device Packaging HiTEC HiTEN & CICMT) · 1
2012 · Zhiwei (Tony) Gong, Scott Hayes, et al. · Additional Conferences (Device Packaging HiTEC HiTEN & CICMT)
2011 · Scott Hayes, Navjot Chhabra, et al. · Wafer-Level Packaging Symposium
2011 · George R. Leal, Scott Hayes, et al. · Additional Conferences (Device Packaging HiTEC HiTEN & CICMT)
2007 · Scott Hayes, William Lytle
Works count: 11
Citation count: 167
H-index: 4
I10-index: 3
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