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Nhan Do
Observed name:
Do, Nhan
Institutions:
Microchip Technology (United States),
Microchip Technology (Germany)
Observed institutions:
University of Konstanz,
IBM Research - Almaden,
Microchip Technology (United States),
Microchip Technology (Germany)
OpenAlex ID:
A5103706358
Optical reflectance and scattering studies of nucleation and growth of bubbles at a liquid-solid interface induced by pulsed laser heating
1993
·
Oguz Yavas
, Paul Leiderer
, et al.
·
Physical Review Letters
·
95
PDF
Temperature dependence of optical constants for amorphous silicon
1992
·
Nhan Do
, Leander Klees
, et al.
·
Applied Physics Letters
·
41
Photodeflection probing of the explosion of a liquid film in contact with a solid heated by pulsed excimer laser irradiation
1993
·
Nhan Do
, Leander Klees
, et al.
·
Journal of Applied Physics
·
33
Transmission studies of explosive vaporization of a transparent liquid film on an opaque solid surface induced by excimer-laser-pulsed irradiation
1992
·
P. T. Leung
, Nhan Do
, et al.
·
Journal of Applied Physics
·
27
Temporal profile of optical transmission probe for pulsed-laser heating of amorphous silicon films
1992
·
Hee K. Park
, Xianfan Xu
, et al.
·
Applied Physics Letters
·
23
40nm Embedded Self-Aligned Split-Gate Flash Technology for High-Density Automotive Microcontrollers
2017
·
Danny Shum
, Lai Q. Luo
, et al.
·
IEEE International Memory Workshop (IMW)
·
22
Temperature dependence of optical properties for amorphous silicon at wavelengths of 6328 and 752 nm
1993
·
Oguz Yavas
, Nhan Do
, et al.
·
Optics Letters
·
19
PDF
Split-Gate Floating Poly SuperFlash® Memory Technology, Design, and Reliability
2017
·
Nhan Do
, Hieu Van Tran
, et al.
·
Integrated circuits and systems
·
14
eNVM Technologies Scaling Outlook and Emerging NVM Technologies for Embedded Applications
2016
·
Nhan Do
·
IEEE International Memory Workshop (IMW)
·
13
Explosion of a liquid film in contact with a pulse-heated solid surface detected by the probe-beam deflection method
1992
·
Andrew C. Tam
, Nhan Do
, et al.
·
Optics Letters
·
13
Scaling of split-gate flash memory and its adoption in modern embedded non-volatile applications
2016
·
Nhan Do
·
IEEE International Conference on IC Design and Technology (ICICDT)
·
10
A 55 nm Logic-Process-Compatible, Split-Gate Flash Memory Array Fully Demonstrated at Automotive Temperature with High Access Speed and Reliability
2015
·
Nhan Do
, Latt Tee
, et al.
·
IEEE International Memory Workshop (IMW)
·
10
Scaling of Split-Gate Flash Memory with 1.05V Select Transistor for 28 nm Embedded Flash Technology
2018
·
Nhan Do
, J.W. Yang
, et al.
·
IEEE International Memory Workshop (IMW)
·
6
Computing-in-Memory with SuperFlash® memBrain™ Technology
2022
·
Nhan Do
, Hieu Tran
, et al.
·
IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)
·
5
Modeling split-gate flash memory cell for advanced neuromorphic computing
2018
·
Mandana Tadayoni
, Santosh Hariharan
, et al.
·
IEEE International Conference on Microelectronic Test Structures (ICMTS)
·
5
Common-floating gate test structure for separation of cycling-induced degradation components in split-gate flash memory cells
2014
·
Nhan Do
, Yuri Tkachev
·
IEEE International Conference on Microelectronic Test Structures (ICMTS)
·
5
Performance and Reliability of Technology Qualified 34 Mb Split-Gate eFLASH Macro in 28 nm HKMG
2024
·
Ralf Richter
, Stefan Dünkel
, et al.
·
IEEE International Memory Workshop (IMW)
·
4
Scaling of Split-Gate Flash Memory for Embedded Controllers and Machine Learning Applications
2020
·
Nhan Do
, Steven Lemke
, et al.
·
International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA)
·
4
A novel test structure to implement a programmable logic array using split-gate flash memory cells
2013
·
H. Om'mani
, M. Tadayoni
, et al.
·
IEEE International Conference on Microelectronic Test Structures (ICMTS)
·
4
Reliability and Accuracy of a Qualified Split-Gate Flash In-Memory Compute Technology
2025
·
Steven Lemke
, Louisa Schneider
, et al.
·
IEEE International Memory Workshop (IMW)
·
2
Evaluation of ESF3 Split-Gate Cell Cycling Endurance for Eeprom Applications
2024
·
Steven Lemke
, Louisa Schneider
, et al.
·
IEEE International Integrated Reliability Workshop final report
·
2
Program Disturb Mechanism in Embedded SuperFlash® Technology
2020
·
Clyde Dunn
, John MacPeak
, et al.
·
IEEE International Reliability Physics Symposium proceedings
·
2
Erase voltage impact on 0.18 μm triple self-aligned split-gate flash memory endurance
2010
·
Dong Yaoqi
, Kong Weiran
, et al.
·
Journal of Semiconductors
·
2
Enhance the split-gate flash cell performance by partially decoupling the SG oxide thickness from the tunnel oxide thickness
2009
·
Yaoqi Dong
, Weiran Kong
, et al.
·
Solid-State Electronics
·
1
Demonstration of Fundamental Weight Accuracy Limits Using Bi-Directional Tuning of SuperFlash ESF3 Cells for Neuromorphic Computing
2026
·
Louisa Schneider
, Steven Lemke
, et al.
·
IEEE International Reliability Physics Symposium proceedings
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Works count:
27
Citation count:
362
H-index:
10
I10-index:
12
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