Author

Yoonho Khang

2009 · Cheolkyu Kim, Dongmin Kang, et al. · Applied Physics Letters · 99
2008 · Cheolkyu Kim, Dong-Seok Suh, et al. · Applied Physics Letters · 67
2008 · Sung-Wook Nam, Cheolkyu Kim, et al. · Applied Physics Letters · 50
2009 · Tae-Yon Lee, Kijoon H. P. Kim, et al. · Applied Physics Letters · 49
2010 · Dong-Seok Suh, Cheolkyu Kim, et al. · Applied Physics Letters · 48
2006 · Jae-Hyeon Eom, Young-Gui Yoon, et al. · Physical Review B · 37
2005 · H.R. Yoon, W. Jo, et al. · Journal of Non-Crystalline Solids · 31
2009 · Sung-Wook Nam, Dongbok Lee, et al. · Electrochemical and Solid-State Letters · 29
2008 · H. J. Shin, Youn-Seon Kang, et al. · Applied Physics Letters · 27
2007 · Gyeong-Su Park, Ji-Hwan Kwon, et al. · Journal of Applied Physics · 26
2009 · Yoonho Khang, Joohyun Lee · Journal of Nanoparticle Research · 22
1997 · Se-Jong Kahng, J. Y. Park, et al. · Journal of Vacuum Science & Technology A Vacuum Surfaces and Films · 22
2008 · Tae-Yon Lee, Cheolkyu Kim, et al. · Applied Physics Letters · 18
1999 · Yoonho Khang, Yeonjoon Park, et al. · Review of Scientific Instruments · 16
2013 · Jeongsu Kim, Daniel Hong, et al. · The Journal of Physical Chemistry C · 15
2007 · Dohyun Lee, Sang Sun Lee, et al. · Applied Physics Letters · 13
1996 · K. M. Mang, Y. Khang, et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 12
1994 · Yoonho Khang, S. J. Kahng, et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 11
2006 · D.- S. Suh, K.H.P. Kim, et al. · Technical digest - International Electron Devices Meeting/Technical digest · 9
1996 · Y. Khang, Y. Kuk · Physical review. B, Condensed matter · 9
2009 · Anass Benayad, YounSeon Kang, et al. · Journal of Applied Physics · 6
2008 · Jino Im, Jae-Hyeon Eom, et al. · Physical Review B · 6
Works count: 49
Citation count: 744
H-index: 16
I10-index: 20
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