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Alexis Drouin
Observed names:
Alexis, Drouin,
Drouin, Alexis
Institution:
Soitec (France)
Observed institution:
Soitec (France)
OpenAlex ID:
A5110664006
Smart Cut™ Piezo On Insulator (POI) substrates for high performances SAW components
2020
·
Eric Butaud
, Brice Tavel
, et al.
·
IEEE International Ultrasonics Symposium
·
59
150 mm SiC Engineered Substrates for High-Voltage Power Devices
2022
·
Séverin Rouchier
, Gweltaz Gaudin
, et al.
·
Materials science forum
·
27
PDF
Comparative study of methods for counting of dislocations in 4H-SiC
2023
·
Christian Kranert
, Paul Wimmer
, et al.
·
Materials Science in Semiconductor Processing
·
13
Rocking Curve Imaging Investigation of the Long-Range Distortion Field between Parallel Dislocations with Opposite Burgers Vectors
2021
·
Thu Nhi Tran Caliste
, Alexis Drouin
, et al.
·
Applied Sciences
·
13
PDF
Oriented Single-Crystal LiTaO3 Thin Film on Silicon for High Performances SAW Components
2018
·
Marie Gorisse
, Alexis Drouin
, et al.
·
IEEE International Ultrasonics Symposium
·
12
Poly-SiC Characterization and Properties for SmartSiC™
2024
·
Hugo Biard
, Alexis Drouin
, et al.
·
Materials science forum
·
4
PDF
High Q-Factor Low Band SAW Filter Based on High Performance POI Substrate
2024
·
Xavier Seah
, Sylvain Ballandras
, et al.
·
IEEE MTT-S International Conference on Microwave Acoustics & Mechanics (IC-MAM)
·
3
SmartSiC™ 150 & 200mm Engineered Substrate: Enabling SiC Power Devices with Improved Performances and Reliability
2025
·
Eric Guiot
, Gonzalo Picun
, et al.
·
Materials science forum
·
2
PDF
Crystal Originated Defect Monitoring and Reduction in Production Grade SmartSiC™ Engineered Substrates
2024
·
Enrica Cela
, Kassem Alassaad
, et al.
·
Defect and diffusion forum/Diffusion and defect data, solid state data. Part A, Defect and diffusion forum
·
2
PDF
Application of Advanced Characterization Techniques to SmartSiC™ Product for Substrate-Level Device Performance Optimization
2024
·
Alexis Drouin
, Roland B. Simon
, et al.
·
Materials science forum
·
2
PDF
New generation of composite substrates based on a layer of LiTaO3 on silicon for surface acoustic waves components
2020
·
Clairet, Alexandre
, Courjon, Emilie
, et al.
·
HAL
·
2
Ferroelectric Domain Characterization of Submicronic Single-Crystal LiTaO3 Film Obtained by Smart Cut Process for High-Performance SAW Devices
2019
·
Alexis, Drouin
, Albertini, David
, et al.
·
HAL
·
2
SiC engineered substrate: increasing SiC MOSFETs current density from device to module level
2024
·
Eric Guiot
, Frédéric Allibert
, et al.
·
Conference proceedings/Conference proceedings - IEEE Applied Power Electronics Conference and Exposition
·
1
Mitigation of bipolar degradation in 4H-SiC power devices using engineered SiC substrates
2026
·
Endong Zhang
, Alexis Drouin
, et al.
·
Materials Science in Semiconductor Processing
Spurious signal control for SAW devices on POI substrates
2026
·
Sylvain Ballandras
, Emilie Courjon
, et al.
·
IEEE MTT-S International Conference on Microwave Acoustics & Mechanics (IC-MAM)
Stabilization of head-to-Head Domain Walls by Light Ion Implantation and Annealing in LiTaO3 Single Crystals
2025
·
Montoussé, Joachim
, Nataf, Guillaume F.
, et al.
·
HAL
Ferroelectric inversion layer induced by ion implantation and annealing in LiTaO3 single crystals
2024
·
Montoussé, Joachim
, Nataf, Guillaume F.
, et al.
·
HAL
SmartSiC™ 150 & 200mm engineered substrate: increasing SiC power device current density up to 30%
2024
·
Guiot, Eric
, Allibert, Frédéric
, et al.
·
Fraunhofer-Publica (Fraunhofer-Gesellschaft)
An advanced Bragg diffraction imaging technique to characterize defects in SiC and GaN : Topic/category, e.g. AM: Advanced Metrology
2022
·
Thu Nhi Tran Thi Caliste
, Lutz Kirste
, et al.
·
ASMC proceedings
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Works count:
23
Citation count:
142
H-index:
5
I10-index:
5
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