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Kazuto Ikeda

Raman scattering from spin fluctuations in Pr2−x Cex CuO4−y , Nd2−x Cex CuO4−y , and Sm2−x Cex CuO4−y
1991 · Izumi Tomeno, Masashi Yoshida, et al. · Physical review. B, Condensed matter · 48
Shift of x-ray-photoelectron core levels in Bi2 Sr2 Ca1−x Yx Cu2 Oy : An explanation by bond-valence-sum calculation
1991 · Rittaporn Itti, F. Munakata, et al. · Physical review. B, Condensed matter · 42
High T/sub c/ BiSrCaCuO superconductor grown by CVD technique
1989 · M. Ihara, T. Kimura, et al. · IEEE Transactions on Magnetics · 36
Precise determination of band offsets and chemical states in SiN∕Si studied by photoemission spectroscopy and x-ray absorption spectroscopy
2005 · S. Toyoda, J. Okabayashi, et al. · Applied Physics Letters · 32
Control of oxidation and reduction reactions at HfSiO∕Si interfaces through N exposure or incorporation
2008 · H. Kamada, T. Tanimura, et al. · Applied Physics Letters · 24
Photoelectron spectroscopic study of Ba1−x Rbx BiO3
1991 · R. Itti, I. Tomeno, et al. · Physical review. B, Condensed matter · 22
Mechanism of Hf-silicide formation at interface between poly-Si electrode and HfO2∕Si gate stacks studied by photoemission and x-ray absorption spectroscopy
2006 · H. Takahashi, J. Okabayashi, et al. · Journal of Applied Physics · 19
Single crystal growth and characterization of Bi2Sr2Ca1−xYxCu2Oy by TSFZ method
1991 · K. Takamuku, K. Ikeda, et al. · Physica C Superconductivity · 18
Study of a Negative Threshold Voltage Shift in Positive Bias Temperature Instability and a Positive Threshold Voltage Shift the Negative Bias Temperature Instability of Yttrium-Doped HfO2 Gate Dielectrics
2010 · Motoyuki Sato, Satoshi Kamiyama, et al. · Japanese Journal of Applied Physics · 15
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Chemical‐state‐resolved in‐depth profiles of gate‐stack structures on Si studied by angular‐dependent photoemission spectroscopy
2008 · S. Toyoda, J. Okabayashi, et al. · Surface and Interface Analysis · 15
Annealing-time dependence in interfacial reaction between poly-Si electrode and HfO2∕Si gate stack studied by synchrotron radiation photoemission and x-ray absorption spectroscopy
2006 · H. Takahashi, J. Okabayashi, et al. · Applied Physics Letters · 15
Electronic structure of the BaV1−x Tix S3 system as studied by photoelectron spectroscopy
1991 · R. Itti, T. Wada, et al. · Physical review. B, Condensed matter · 14
Photoelectron spectroscopic study of ϰ-(BEDT-TTF)2Cu(NCS)2 organic superconductor
1991 · R. Itti, H. Mori, et al. · Physica C Superconductivity · 12
Thermal stability in a-Si/HfSiO(N)/Si gate stack structures studied by photoemission spectroscopy using synchrotron radiation
2008 · S. Toyoda, H. Kamada, et al. · Applied Physics Letters · 10
Advanced Flash Lamp Annealing technology for 22nm and further device
2010 · Hiroki Kiyama, Shinichi Kato, et al. · International Workshop on Junction Technology · 8
Ti-capping technique as a breakthrough for achieving low threshold voltage, high mobility, and high reliability of pMOSFET with metal gate and high-k dielectrics technologies
2009 · Haruhiko Takahashi, Hiroshi Minakata, et al. · Technical digest - International Electron Devices Meeting/Technical digest · 8
Negatively charged deep level defects generated by Yttrium and Lanthanum incorporation into HfO2 for Vth adjustment, and the impact on TDDB, PBTI and 1/f noise
2009 · Motoyuki Sato, Satoshi Kamiyama, et al. · Technical digest - International Electron Devices Meeting/Technical digest · 8
Suppression of the Phase Transition to C54 TiSi2 due to Epitaxial Growth of C49 TiSi2 on Si(001) Substrates in Silicidation Process
1996 · Satoshi Komiya, Hirofumi Tomita, et al. · Japanese Journal of Applied Physics · 8
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A low-temperature ultrahigh vacuum scanning tunneling microscope system and tunneling spectra of the Bi2212 superconductor
1993 · Kazuto Ikeda, Kenshi Takamuku, et al. · Review of Scientific Instruments · 8
Photoelectron spectroscopic observation of metal-nonmetal transition in Bi2Sr2Ca1−xYxCu2Oy system
1990 · R Itti, F Munakata, et al. · Physica B Condensed Matter · 8
Annealing Study of Bi-Sr-Ca-Cu-O Superconducting Thin Film
1989 · Kazuto Ikeda, Kotaro Gotoh, et al. · Japanese Journal of Applied Physics · 8
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Analysis of x‐ray irradiation effect in high‐ k gate dielectrics by time‐dependent photoemission spectroscopy using synchrotron radiation
2008 · T. Tanimura, S. Toyoda, et al. · Surface and Interface Analysis · 7
Depth profiling of chemical states and charge density in HfSiON by photoemission spectroscopy using synchrotron radiation
2008 · T. Tanimura, S. Toyoda, et al. · Applied Physics Letters · 7
Atomic resolution scanning tunneling spectroscopic studies of Bi2Sr2CaCu2Oy single crystals
1992 · Kazuto Ikeda, Kenshi Takamuku, et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 7
Ultrahigh vacuum STM studies of the Bi–O surface of Bi2212
1992 · Kazuto Ikeda, Kenshi Takamuku, et al. · Journal of materials research/Pratt's guide to venture capital sources · 7
Works count: 83
Citation count: 507
H-index: 12
I10-index: 14
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