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Phuc Duong Van

Novel noncontact thickness metrology for backend manufacturing of wide bandgap light emitting devices
2005 · Wojtek J. Walecki, Kevin Lai, et al. · Physica status solidi. C, Conferences and critical reviews/Physica status solidi. C, Current topics in solid state physics · 15
Low-coherence interferometric absolute distance gauge for study of MEMS structures
2005 · Wojciech J. Walecki, Kevin Lai, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 15
Novel low coherence metrology for nondestructive characterization of high-aspect-ratio microfabricated and micromachined structures
2004 · Wojciech Walecki, Frank Wei, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 12
Non-contact Electrical Measurements of Sheet Resistance and Leakage Current Density for Ultra-shallow (and other) Junctions
2004 · Vladimir N. Faifer, Michael I. Current, et al. · MRS Proceedings · 10
Non-contact fast wafer metrology for ultra-thin patterned wafers mounted on grinding and dicing tapes
2004 · W. Walecki, V. Suchkov, et al. · IEEE/CPMT International Electronics Manufacturing Technology Symposium · 8
Novel Noncontact Thickness Metrology for Partially Transparent and Nontransparent Wafers for Backend Semiconductor Manufacturing
2004 · Wojciech J. Walecki, Vitali Souchkov, et al. · MRS Proceedings · 5
Low Coherence Interferometric Metrology for Ultra-thin MEMs Structures
2004 · Wojciech Walecki, Frank Wei, et al. · MRS Proceedings · 4
Investigation of the Optical Properties in the Infrared Region of PbS Thin Films
2024 · Bao Quy Le, Dat Tran Quang, et al. · Acta Polytechnica Hungarica · 1
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Systematic optimization of electron and hole transport layers for double perovskite solar cells using SCAPS-1D software
2026 · Phuong Le Thi Phuong, Phuc Duong Van, et al. · Engineering Research Express
Works count: 10
Citation count: 70
H-index: 5
I10-index: 4
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