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Takashi Ishida
Institution:
ROHM
Observed institution:
ROHM
ORCID:
0009-0001-3690-7232
Observed ORCID:
0009-0001-3690-7232
OpenAlex ID:
A5112306937
Accurate and Fast Testing Technique of Operational Amplifier DC Offset Voltage in µV-Order by DC-AC Conversion
2019
·
Yuto Sasaki
, Tamotsu Ichikawa
, et al.
·
IEEE International Test Conference in Asia (ITC-Asia)
·
9
Optimization of Input and Sampling Frequencies for Accurate ADC Dynamic Testing Using Incoherent Sampling
2026
·
Keno Sato
, Toshiyuki Okamoto
, et al.
·
IEEE Transactions on Instrumentation and Measurement
·
2
Design Consideration for LC Analog Filters: Inductor ESR Compensation, Mutual Inductance Effect and Variable Center Frequency
2023
·
Misaki Takagi
, Takayuki Nakatani
, et al.
·
Lecture notes in networks and systems
·
2
High Precision Measurement of Sub-Nano Ampere Current in ATE Environment
2021
·
Keno Sato
, Takayuki Nakatani
, et al.
·
Proceedings - Asian Test Symposium/Proceedings
·
1
Hardware-Efficient Low-Distortion Sinusoidal Signal Generator Using FPGA-Based Dual-DAC Digital Predistortion
2026
·
Keno Sato
, Takayuki Nakatani
, et al.
·
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Thermal Effect and Calibration for High Precision On-Wafer Analog IC Probe Testing
2024
·
Daisuke Iimori
, Takayuki Nakatani
, et al.
·
IEEE International Conference on Solid-State and Integrated Circuit Technology
中電圧モータドライブのためのモジュラマルチレベルDSCCインバータとTSBCコンバータの実験的比較【Powered by NICT】
2017
·
Yuhei Okazaki
, Wataru Kawamura
, et al.
·
IEEE Transactions on Power Electronics
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Works count:
7
Citation count:
14
H-index:
2
I10-index:
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