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Ah-Jin Jo

Observed names: Ah Jin Jo, Ah-jin Jo, Ahjin Jo
OpenAlex ID: A5113816018
High-speed lateral scanning white-light phase shift interferometry
2024 · Jaeseung Im, Byoung-Woon Ahn, et al. · Optics Express · 18
Automated measurement and analysis of sidewall roughness using three-dimensional atomic force microscopy
2022 · Su-Been Yoo, Seong-Hun Yun, et al. · Han-guk hyeonmigyeong hakoeji/Applied microscopy · 17
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“Multipoint Force Feedback” Leveling of Massively Parallel Tip Arrays in Scanning Probe Lithography
2015 · Hanaul Noh, Goo-Eun Jung, et al. · Small · 12
High-throughput automatic defect review for 300mm blank wafers with atomic force microscope
2015 · Ardavan Zandiatashbar, Byong Kim, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 9
Automatic Defect Review of a Patterned Wafer using Hybrid Metrology
2021 · ByungWoon Ahn, Ahjin Jo, et al. · IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) · 6
High-precision infrared-light interferometry for accurate overlay and alignment in three-dimensional semiconductor packaging
2025 · Jaeseung Im, Hyuntae Kim, et al. · Optics & Laser Technology · 5
In-line atomic resolution local nanotopography variation metrology for CMP process
2017 · T.-G. Kim, Natasja Heylen, et al. · 3
In-Line Critical Dimension and Sidewall Roughness Metrology Study for Compound Nanostructure Process Control by in-Line 3D Atomic Force Microscope
2016 · Tae-Gon Kim, Heon-Yul Ryu, et al. · ECS Transactions · 3
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In-line metrology for atomic resolution local height variation
2017 · Tae-Gon Kim, Soon-Wook Kim, et al. · ASMC proceedings · 2
Lithography: “Multipoint Force Feedback” Leveling of Massively Parallel Tip Arrays in Scanning Probe Lithography (Small 35/2015)
2015 · Hanaul Noh, Goo-Eun Jung, et al. · Small · 1
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Atomic Force Microscope: A Window into the Nanoworld
2025 · Chul-Goo Kang, Ah-Jin Jo, et al. · International Conference on Control, Automation and Systems (ICCAS)
Simultaneous 3d characterization and repair of EUV mask defects
2023 · Sang-Joon Cho, Byoung-Woon Ahn, et al. · SPIE Photomask Technology Conference
In-line metrology for atomic resolution local height variation
2017 · Tae-Gon Kim, Soon-Wook Kim, et al. · International Convention on Information and Communication Technology, Electronics and Microelectronics
Atomic Resolution Quality Control for Fin Oxide Recess by Atomic Resolution Profiler
2016 · Tae Gon Kim, Heon Yul Ryu, et al. · Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena
In-Line Critical Dimension and Sidewall Roughness Metrology Study for Compound Nanostructure Process Control by in-Line 3D Atomic Force Microscope
2016 · Tae-Gon Kim, Heon-Yul Ryu, et al. · ECS Meeting Abstracts
Works count: 15
Citation count: 76
H-index: 5
I10-index: 3
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