Author

Ivan Kuznietsov

Observed name: Kuznietsov, Ivan

Institution: Fraunhofer Institute for Photonic Microsystems

Observed institutions: National Yang Ming Chiao Tung University, Fraunhofer Institute for Photonic Microsystems

OpenAlex ID: A5117812827

Novel Nondestructive Methodology Using PV Measurement With NLS-Based Analysis and GIXRD for Comprehensive O/T/M Phase Analyses in Ferroelectric HZO

2025 · Hsien-Yang Liu, Wei-Cheng Peng, et al. · IEEE Transactions on Electron Devices · 5

Separating Depolarization-Induced Retention Loss and Imprint in HfO 2 -Based Ferroelectric Capacitors

2026 · David Lehninger, Hafizh Luqman Yamtomo, et al. · IEEE International Symposium on Applications of Ferroelectrics (ISAF)

Investigation of the Gate Dimension Influences on Performance and Reliability of Silicon-Doped Hafnium Oxide (HSO) FeFETs

2025 · Kuznietsov, Ivan, Liu, Hsienyang, et al. · Fraunhofer-Publica (Fraunhofer-Gesellschaft)

Works count: 3

Citation count: 5

H-index: 1

I10-index: