Concept

Device under test

OpenAlex ID: C76249512

Improved three-step de-embedding method to accurately account for the influence of pad parasitics in silicon on-wafer RF test-structures

2001 · E.P. Vandamme, D.M.M.-P. Schreurs, et al. · IEEE Transactions on Electron Devices · 268

A Rigorous Technique for Measuring the Scattering Matrix of a Multiport Device with a 2-Port Network Analyzer

1982 · J.C. Tippet, R.A. Speciale · IEEE Transactions on Microwave Theory and Techniques · 237

Rydberg-atom-based digital communication using a continuously tunable radio-frequency carrier

2019 · Zhenfei Song, Hongping Liu, et al. · Optics Express · 180

On correlating TEM cell and OATS emission measurements

1995 · P. Wilson · IEEE Transactions on Electromagnetic Compatibility · 180

Accuracy improvements in microwave noise parameter measurements

1989 · A.C. Davidson, B.W. Leake, et al. · IEEE Transactions on Microwave Theory and Techniques · 144

5G Over-the-Air Measurement Challenges: Overview

2017 · Yihong Qi, Guang Yang, et al. · IEEE Transactions on Electromagnetic Compatibility · 139

A Generalization of the TSD Network-Analyzer Calibration Procedure, Covering n-Port Scattering-Parameter Measurements, Affected by Leakage Errors

1977 · R.A. Speciale · IEEE Transactions on Microwave Theory and Techniques · 137

Smart simulation using collaborative formal and simulation engines

2000 · Pei Hsin Ho, Thomas R. Shiple, et al. · 118

Radiated Two-Stage Method for LTE MIMO User Equipment Performance Evaluation

2014 · Wei Yu, Yihong Qi, et al. · IEEE Transactions on Electromagnetic Compatibility · 116

A Quasi-Optical Free-Space Measurement Setup Without Time-Domain Gating for Material Characterization in the $W$-Band

2006 · Daniel Bourreau, Alain Peden, et al. · IEEE Transactions on Instrumentation and Measurement · 114

An improved calibration technique for on-wafer large-signal transistor characterization

1993 · A. Ferrero, U. Pisani · IEEE Transactions on Instrumentation and Measurement · 111

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Study of self-heating effects, temperature-dependent modeling, and pulsed load-pull measurements on GaN HEMTs

2001 · S. Nuttinck, E. Gebara, et al. · IEEE Transactions on Microwave Theory and Techniques · 110

Carving differential unit test cases from system test cases

2006 · Sebastian Elbaum, Hui Nee Chin, et al. · ACM Joint European Software Engineering Conference and Symposium on the Foundations of Software Engineering (ESEC/FSE) · 92

A Signature Test Framework for Rapid Production Testing of RF Circuits

2002 · R. Voorakaranam, S. Cherubal, et al. · Design, Automation, and Test in Europe · 91

A signature test framework for rapid production testing of RF circuits

2003 · R. Voorakaranam, S. Cherubal, et al. · Design, Automation, and Test in Europe · 85

Cosmic radiation as a cause for power device failure and possible countermeasures

2002 · H. Kabza, H.-J. Schulze, et al. · IEEE International Symposium on Power Semiconductor Devices and ICs/Proceedings of the International Symposium on Power Semiconductor Devices & ICs/Proceedings of the ... International Symposium on Power Semiconductor Devices & ICs/Proceedings of the ... International Symposium on Power Semiconductor Devices and ICs · 82

A new implementation of a multiport automatic network analyzer

1992 · A. Ferrero, U. Pisani, et al. · IEEE Transactions on Microwave Theory and Techniques · 82

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A Cost-Effective SDR Platform for Performance Characterization of RFID Tags

2011 · Luca Catarinucci, Danilo De Donno, et al. · IEEE Transactions on Instrumentation and Measurement · 81

Error-corrected large-signal waveform measurement system combining network analyzer and sampling oscilloscope capabilities

1990 · G. Kompa, F. van Raay · IEEE Transactions on Microwave Theory and Techniques · 72

The AIDA-2020 TLU: a flexible trigger logic unit for test beam facilities

2019 · P. Baesso, D. Cussans, et al. · Journal of Instrumentation · 70

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On-line monitoring of the MOSFET device junction temperature by computation of the threshold voltage

2006 · H. Chen, V. Pickert, et al. · IET International Conference on Power Electronics, Machines and Drives (PEMD) · 67

RF-BIST: loopback spectral signature analysis

2003 · D. Lupea, U. Pursche, et al. · Design, Automation, and Test in Europe · 67

Midfield Over-the-Air Test: A New OTA RF Performance Test Method for 5G Massive MIMO Devices

2019 · Hongwei Kong, Zhu Wen, et al. · IEEE Transactions on Microwave Theory and Techniques · 66

Design Methodology of DC Power Cycling Test Setup for SiC MOSFETs

2019 · Fei Yang, Enes Ugur, et al. · IEEE Journal of Emerging and Selected Topics in Power Electronics · 65

TestART: Improving LLM-based Unit Test ing via Co-evolution of A utomated Generation and R epair I t eration

2026 · Siqi Gu, Quanjun Zhang, et al. · ACM Transactions on Software Engineering and Methodology · 63

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Works count: 3,102

Citation count: 12,620