Work

A signature test framework for rapid production testing of RF circuits

Year: 2003

Type: conference-paper

Source: Design, Automation, and Test in Europe

DOI: 10.1109/date.2002.998268

Authors: R. Voorakaranam, S. Cherubal, A. Chatterjee

Institution: Georgia Institute of Technology

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4241361977

FWCI: 7.966

Cites: 6

Cited by: 85

Related to: 10