Source

Proceedings/Proceedings - International Test Conference

ISSNs: 1089-3539, 2378-2250

Source type: conference

Alternate names: ITC, Proceedings of the International Test Conference, International Test Conference, IEEE International Test Conference (ITC), Proceedings of 1995 IEEE International Test Conference (ITC), Proceedings of IEEE International Test Conference - (ITC)

Fully OA: No

DOAJ: No

OpenAlex ID: S4210209697

Testing embedded-core based system chips

2002 · Y. Zorian, E.J. Marinissen, et al. · Proceedings/Proceedings - International Test Conference · 425

Embedded deterministic test for low cost manufacturing test

2003 · J. Rajski, J. Tyszer, et al. · Proceedings/Proceedings - International Test Conference · 402

OPMISR: the foundation for compressed ATPG vectors

2002 · C. Barnhart, V. Brunkhorst, et al. · Proceedings/Proceedings - International Test Conference · 343

A structured and scalable mechanism for test access to embedded reusable cores

2002 · E.J. Marinissen, R. Arendsen, et al. · Proceedings/Proceedings - International Test Conference · 342

A set of benchmarks for modular testing of SOCs

2003 · E.J. Marinissen, V. Iyengar, et al. · Proceedings/Proceedings - International Test Conference · 309

Minimized power consumption for scan-based BIST

2003 · S. Gerstendorfer, H.-J. Wunderlich · Proceedings/Proceedings - International Test Conference · 302

Which concurrent error detection scheme to choose ?

2002 · S. Mitra, E.J. McCluskey · Proceedings/Proceedings - International Test Conference · 302

Testing 3D chips containing through-silicon vias

2009 · Erik Jan Marinissen, Yervant Zorian · Proceedings/Proceedings - International Test Conference · 301

Logic BIST for large industrial designs: real issues and case studies

2003 · G. Hetherington, T. Fryars, et al. · Proceedings/Proceedings - International Test Conference · 281

Test vector decompression via cyclical scan chains and its application to testing core-based designs

2002 · A. Jas, N.A. Touba · Proceedings/Proceedings - International Test Conference · 275

An experimental chip to evaluate test techniques experiment results

2002 · S.C. Ma, P. Franco, et al. · Proceedings/Proceedings - International Test Conference · 274

Adapting scan architectures for low power operation

2002 · L. Whetsel · Proceedings/Proceedings - International Test Conference · 267

Too much delay fault coverage is a bad thing

2002 · J. Rearick · Proceedings/Proceedings - International Test Conference · 266

Compactest: a Method to Generate Compact Test Sets for Combinational Circuits

2005 · I. Pomeranz, L.N. Reddy, et al. · Proceedings/Proceedings - International Test Conference · 261

A structured test re-use methodology for core-based system chips

2002 · P. Varma, B. Bhatia · Proceedings/Proceedings - International Test Conference · 260

Preferred Fill: A Scalable Method to Reduce Capture Power for Scan Based Designs

2006 · Santiago Remersaro, Xijiang Lin, et al. · Proceedings/Proceedings - International Test Conference · 239

FRITS - a microprocessor functional BIST method

2003 · P. Parvathala, K. Maneparambil, et al. · Proceedings/Proceedings - International Test Conference · 238

Test vector encoding using partial LFSR reseeding

2002 · C.V. Krishna, A. Jas, et al. · Proceedings/Proceedings - International Test Conference · 232

Wrapper design for embedded core test

2002 · E.J. Marinissen, S.K. Goel, et al. · Proceedings/Proceedings - International Test Conference · 231

Analog and mixed-signal benchmark circuits-first release

2002 · B. Kaminska, K. Arabi, et al. · Proceedings/Proceedings - International Test Conference · 224

X-compact: an efficient response compaction technique for test cost reduction

2003 · S. Mitra, Kee Sup Kim · Proceedings/Proceedings - International Test Conference · 217

Diagnosing combinational logic designs using the single location at-a-time (SLAT) paradigm

2002 · T. Bartenstein, D. Heaberlin, et al. · Proceedings/Proceedings - International Test Conference · 208

Intrinsic leakage in low power deep submicron CMOS ICs

2002 · A. Keshavarzi, K. Roy, et al. · Proceedings/Proceedings - International Test Conference · 203

Scan chain design for test time reduction in core-based ICs

2002 · J. Aerts, E.J. Marinissen · Proceedings/Proceedings - International Test Conference · 202

Defect classes-an overdue paradigm for CMOS IC testing

2002 · C.F. Hawkins, J.M. Soden, et al. · Proceedings/Proceedings - International Test Conference · 201

PDF

Works count: 3,576

Citation count: 61,630

H-index: 101

I10-index: 1,402

2yr mean citedness: 1.395