Work

Function-Specific Testing

Year: 1989

Type: book-chapter

Source: Kluwer international series in engineering and computer science

DOI: 10.1007/978-1-4613-1625-1_8

Author: Stuart K. Tewksbury

Institution: AT&T (United States)

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W120459472

FWCI:

Cites: 59

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Related to: 10