Work

Checking Experiments for Scan Chain Lathes and Flip-FLops

Year: 1997

Type: article

Author: Samy Makar

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W127378424

FWCI:

Cites:

Cited by: 1

Related to: 10