Work

Advanced Scanning Electron Microscopy and X-Ray Microanalysis

Year: 1986

Type: book

Source: Springer eBooks

DOI: 10.1007/978-1-4757-9027-6

Authors: Dale E. Newbury, David C. Joy, Patrick Echlin, Charles E. Fiori, Joseph I. Goldstein

Institutions: National Institute of Standards and Technology, AT&T (United States), University of Cambridge, National Institutes of Health, Lehigh University

Language: English

Topic: Electron and X-Ray Spectroscopy Techniques

Subfield: Surfaces, Coatings and Films

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W1540359784

FWCI: 4.12

Cites:

Cited by: 413

Related to: 10

Parts: 9