Work

Silicon symptoms to solutions: applying design for debug techniques

Year: 2003

Type: conference-paper

Source: IEEE International Test Conference (ITC)

DOI: 10.1109/test.2002.1041818

Authors: C. Pyron, R. Bangalore, D. Belete, J. Goertz, A. Razdan, D. Younger

Institution: Motorola (United States)

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W1573779398

FWCI: 1.192

Cites: 6

Cited by: 13

Related to: 10