High Resolution X-ray Diffractometry and Topography of Float-Zone GaAs Crystals Grown in Microgravity
Year: 1994
Type: article
Source: Advances in X-ray Analysis
Authors: N. Loxley, C. D. Moore, M. Safa, B. K. Tanner, G. F. Clark, F. M. Herrmann, G. Mueller
Language: English
Subfield: Materials Chemistry
Field: Materials Science
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W1582429910
