Work

FRITS - a microprocessor functional BIST method

Year: 2003

Type: conference-paper

Source: IEEE International Test Conference (ITC)

DOI: 10.1109/test.2002.1041810

Authors: P. Parvathala, K. Maneparambil, W. Lindsay

Institution: Intel (United States)

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W1891950198

FWCI: 8.421

Cites: 15

Cited by: 234

Related to: 10