Work

Semiconductor core-level to valence-band maximum binding-energy differences: Precise determination by x-ray photoelectron spectroscopy

Year: 1983

Type: article

Source: Physical review. B, Condensed matter

DOI: 10.1103/physrevb.28.1965

Authors: E. A. Kraut, R. W. Grant, J. R. Waldrop, S. P. Kowalczyk

Institution: Rockwell International (United States)

Language: English

Topic: Electron and X-Ray Spectroscopy Techniques

Subfield: Surfaces, Coatings and Films

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W1964921084

FWCI: 3.434

Cites: 52

Cited by: 521

Related to: 10