Patterson function from low-energy electron diffraction measured intensities and structural discrimination
Year: 2003
Type: article
Abstract: Surface patterson functions have been derived by direct inversion of experimental low-energy electron diffraction I-V spectra measured at multiple incident angles. The direct inversion is computationally simple and can be used to discriminate between different structural models. $(1\ifmmode\times\else\texttimes\fi{}1)$ $Y{\mathrm{Si}}_{2}$ epitaxial layers grown on Si(111) have been used to illustrate the analysis. We introduce a suitable R factor for the Patterson function to make the structural discrimination as objective as possible. From six competing models needed to complete the geometrical search, four could easily be discarded, achieving a very significant and useful reduction in the parameter space to be explored by standard dynamical low-energy electron diffraction methods. The amount and quality of data needed for this analysis is discussed.
Language: English
Subfield: Surfaces, Coatings and Films
Field: Materials Science
Domain: Physical Sciences
Open Access status: green
OpenAlex ID: W1965416429