Work

Dictionary-based sparse representation for resolution improvement in laser voltage imaging of CMOS integrated circuits

Year: 2015

Type: article

Source: Design, Automation, and Test in Europe

DOI: 10.5555/2755753.2755888

Authors: T. Berkin Cilingiroglu, Mahmoud Zangeneh, Aydan Uyar, W.C. Karl, Janusz Konrad, Ajay Joshi, Bennett B. Goldberg, M. Selim Ünlü

Institution: Boston University

Language: English

Topic: Integrated Circuits and Semiconductor Failure Analysis

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W1971802165

FWCI: 0.28

Cites: 12

Cited by: 3

Related to: 10