Leakage current in Ti/4H-SiC Schottky barrier diode
Year: 2006
Type: article
Source: Physica B Condensed Matter
Authors: K. Ohtsuka, Y. Matsuno, K. Kuroda, H. Sugimoto, Y. Tarui, M. Imaizumi, T. Takami
Institution: Mitsubishi Electric (Japan)
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W1975934533