Work

Measurement of ion‐induced secondary electron emission yield of MgO films by pulsed ion beam method

Year: 2002

Type: article

Source: Journal of Information Display

DOI: 10.1080/15980316.2002.9651886

Authors: Sang Kook Lee, Jae Hong Kim, Ji Hwa Lee, Ki Woong Whang

Institution: Seoul National University

Language: English

Topic: Electron and X-Ray Spectroscopy Techniques

Subfield: Surfaces, Coatings and Films

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W1981066646

FWCI:

Cites: 4

Cited by: 1

Related to: 10