Work

Testing for Single Intermittent Failures in Combinational Circuits by Maximizing the Probability of Fault Detection

Year: 1980

Type: article

Source: IEEE Transactions on Computers

DOI: 10.1109/tc.1980.1675595

Author: Savir

Institution: IBM Research - Thomas J. Watson Research Center

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W1981998105

FWCI: 6.139

Cites: 21

Cited by: 31

Related to: 10