Work

Sneak-path Testing of Memristor-based Memories

Year: 2013

Type: conference-paper

Source: International Conference on VLSI Design and International Conference on Embedded Systems (VLSID)

DOI: 10.1109/vlsid.2013.219

Authors: Sachhidh Kannan, Jeyavijayan Rajendran, Ramesh Karri, Ozgur Sinanoglu

Institutions: New York University, New York University Abu Dhabi

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W1982533447

FWCI: 3.925

Cites: 16

Cited by: 59

Related to: 10