Work

Automatic Generation of Microprocessor Test Programs

Year: 1982

Type: conference-paper

Abstract: This paper presents an automatic generation system for behavioral test programs of microprocessors. First, the test environment is presented, as well as its consequences on test program generation. In the second part, the test principles are outlined; it is a behavioral test, i.e a test determined from the user's description of the microprocessor; the resulting test programs are quite modular. The third part presents the description language and the generation system.

Source: ACM/IEEE Design Automation Conference (DAC)

DOI: 10.1109/dac.1982.1585554

Authors: C. Bellon, A. Liothin, S. Sadier, G. Saucier, R. Velazco, F. Grillot, M. Issenman

Institutions: Techniques of Informatics and Microelectronics for Integrated Systems Architecture, Translational Innovation in Medicine and Complexity

Language: English

Topic: Software Testing and Debugging Techniques

Subfield: Software

Field: Computer Science

Domain: Physical Sciences

Open Access status: bronze

OpenAlex ID: W1988304494

FWCI: 1.564

Cites: 11

Cited by: 13

Related to: 10