Work

A power-efficient scan tree design by exploring the Q'-D connection

Year: 2013

Type: conference-paper

Source: IEEE International Symposium on Circuits and Systems proceedings

DOI: 10.1109/iscas.2013.6572022

Authors: Linfeng Chen, Aijiao Cui

Institution: Harbin Institute of Technology

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W2001817755

FWCI: 0.758

Cites: 11

Cited by: 5

Related to: 10