Work

Optimal scan tree construction with test vector modification for test compression

Year: 2003

Type: conference-paper

Source: International Conference on Properties and Applications of Dielectric Materials (ICPADM)

DOI: 10.1109/ats.2003.1250798

Authors: Miyase, Kajihara

Institution: Kyushu Institute of Technology

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2004015493

FWCI: 3.642

Cites: 22

Cited by: 48

Related to: 10