Empirical atomic sensitivity factors for quantitative analysis by electron spectroscopy for chemical analysis
Year: 1981
Type: article
Source: Surface and Interface Analysis
Authors: C. D. Wagner, L. E. Davis, M. V. Zeller, J. A. Taylor, R. H. Raymond, L. H. Gale
Institution: Shell (United States)
Language: English
Subfield: Surfaces, Coatings and Films
Field: Materials Science
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2004239068