Work

Precise Determination of the Valence-Band Edge in X-Ray Photoemission Spectra: Application to Measurement of Semiconductor Interface Potentials

Year: 1980

Type: article

Source: Physical Review Letters

DOI: 10.1103/physrevlett.44.1620

Authors: E. A. Kraut, R. W. Grant, J. R. Waldrop, S. P. Kowalczyk

Institution: Rockwell International (United States)

Language: English

Topic: Electron and X-Ray Spectroscopy Techniques

Subfield: Surfaces, Coatings and Films

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2004967694

FWCI: 10.3

Cites: 9

Cited by: 1,479

Related to: 10