A test pattern matching method on bast architecture using don't care identification for random pattern resistant faults
Year: 2010
Type: conference-paper
Authors: Toshinori Hosokawa, Yun Chen, LingLing Wan, Motohiro Wakazono, Masayoshi Yoshimura
Institutions: Nihon University, Kyushu University
Language: English
Subfield: Hardware and Architecture
Field: Computer Science
Domain: Physical Sciences
Open Access status: closed
Funder: Nihon University
OpenAlex ID: W2016667709